A chip batch rapid detection device
A detection device and chip technology, applied in solid separation, sorting, grading, etc., can solve the problems of inability to perform batch detection, single detection range, slow detection speed, etc., and achieve the effect of fast and effective batch detection.
Active Publication Date: 2021-07-23
深圳市民芳光电有限公司
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Problems solved by technology
[0002] Chip testing is a commonly used device for chip manufacturing. After the chip is manufactured, various tests need to be performed on it. The current chip testing device has a single detection range and can only perform a single test of pressure resistance or thickness, and the detection speed is slow. Each chip is put into the detection device for detection. After the detection is completed, the detection of the next chip is carried out. Batch detection cannot be performed, and the detection speed is slow. For this reason, we have designed a chip batch rapid detection device.
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[0023] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0024] see Figure 1-4 , the present invention provides a technical solution: a batch rapid detection device for chips, including a detection housing 1, a chute 2 is provided on the left side of the inner cavity of the detection housing 1, and a support plate 3 is movably connected to the left side of the inner cavity of the chute 2, and the detection A hydraulic expansion plate 4 matching the position of the chute 2 is installed on the top left side of the in...
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The invention discloses a chip batch rapid detection device in the technical field of chip detection, which includes a detection housing, a chute is provided on the left side of the inner cavity of the detection housing, and a supporting plate is movably connected to the left side of the inner cavity of the chute. A hydraulic expansion plate matching the position of the chute is installed on the left side of the inner cavity of the detection shell, and detection needles are evenly installed on the bottom of the hydraulic expansion plate, and a driving wheel is installed on the left side of the inner cavity of the detection shell, and the driving wheel A servo motor is installed on the rear end, and the fixed rod one and fixed rod two connected to the reciprocating device drive the cleaning brush to clean the blocked chips on the thickness detection groove one and thickness detection groove two, and remove the chips on the thickness detection groove one Move to the second inner cavity of the defective product collection box through the cleaning brush, and the thickness qualified chips blocked by the second thickness detection groove are moved to the inner cavity of the qualified product collection box through the cleaning brush, and the qualified products and defective products are respectively put into the corresponding collection boxes in time , to avoid being scattered and difficult to distinguish.
Description
technical field [0001] The invention relates to the technical field of chip detection, in particular to a chip batch rapid detection device. Background technique [0002] Chip testing is a commonly used device for chip manufacturing. After the chip is manufactured, various tests need to be performed on it. The current chip testing device has a single detection range and can only perform a single test of pressure resistance or thickness, and the detection speed is slow. Each chip is put into the detection device for detection. After the detection, the next chip is detected. Batch detection cannot be performed, and the detection speed is slow. For this reason, we have designed a chip batch rapid detection device. Contents of the invention [0003] The purpose of the present invention is to provide a chip batch rapid inspection device to solve the problems raised in the above-mentioned background technology. [0004] In order to achieve the above object, the present inventio...
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IPC IPC(8): B07C5/34B07C5/02B07B13/05B07B13/16
CPCB07B13/05B07B13/16B07C5/02B07C5/34
Inventor 罗春芳唐兴云
Owner 深圳市民芳光电有限公司