Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Class attendance checking system

A technology of attendance and micro-controller, which is applied in the direction of registration/instruction, time register, instrument, etc., can solve problems such as difficult management of students, and achieve the effect of efficient management

Inactive Publication Date: 2019-03-12
河南汇纳科技有限公司
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, due to the continuous expansion of enrollment in colleges and universities, the number of college students continues to expand, which brings difficulties in student management. Due to the lack of constraints, many students with poor self-control become lazy and decadent after entering college, and the phenomenon of skipping classes is becoming more and more serious , and the existing student attendance system is mostly fingerprint recognition, which cannot avoid the appearance of students skipping classes after punching in, and the development of science and technology has brought the possibility of a more intelligent attendance system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Class attendance checking system
  • Class attendance checking system
  • Class attendance checking system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0022] see Figure 1-4 , the present invention provides a class checking attendance system, comprising a microcontroller, the microcontroller includes a student information input module, a student information database and a student entry and exit information statistics module; the microcontroller is electrically connected with an entry management unit, an exit A management unit, a power supply module, a satellite timing module and a wireless transmission modul...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a class attendance checking system. The class attendance checking system comprises a microcontroller, the microcontroller comprises a student information entry module, a student information database and a student access recording module and is electrically connected with an access management unit, an entering management unit, an exiting management unit, a power source module, a satellite timing module and a wireless transmission module and connected with a background terminal through the wireless transmission module. The class attendance checking system can intelligently and effectively manage attendance of students.

Description

[0001] the field [0002] The invention relates to an attendance checking system, in particular to a class checking attendance system, which belongs to the technical field of class attendance checking systems. Background technique [0003] At present, due to the continuous expansion of enrollment in colleges and universities, the number of college students continues to expand, which brings difficulties in student management. Due to the lack of constraints, many students with poor self-control become lazy and decadent after entering college, and the phenomenon of skipping classes is becoming more and more serious , and the existing student attendance system mostly uses fingerprint recognition, which cannot avoid the appearance of students skipping classes after punching in, and the development of science and technology has brought the possibility of a more intelligent attendance system. Contents of the invention [0004] Purpose of the present invention: To address the shortc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G07C1/10G06K9/00G06Q50/20
CPCG06Q50/205G07C1/10G06V40/12G06V40/16
Inventor 詹望
Owner 河南汇纳科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products