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Measuring equipment and measuring methods

A technology of measuring equipment and measuring method, which is applied in the direction of measuring electrical variables, measuring electricity, measuring devices, etc., and can solve the problems of increased cost of measuring equipment, larger size, and waste of resources.

Active Publication Date: 2021-05-07
KING YUAN ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in actual use, only a part of the comparators are often used, and the unused comparators remain idle
Therefore, this design often leads to increased cost, larger size, and waste of resources for measuring equipment.

Method used

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  • Measuring equipment and measuring methods
  • Measuring equipment and measuring methods
  • Measuring equipment and measuring methods

Examples

Experimental program
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Embodiment Construction

[0041] The implementation and operation principle of the measuring device of the present invention will be described below through multiple embodiments. Those skilled in the technical field of the present invention can understand the characteristics and functions of the present invention through the above-mentioned embodiments, and can combine, modify, replace or transfer based on the spirit of the present invention.

[0042] The term "connection" referred to herein includes direct connection or indirect connection, and is not limited. The terms "when", "when" herein mean "now, before or after" and are not limiting.

[0043] figure 1 It is a schematic diagram of the basic structure of the measuring device 10 according to an embodiment of the present invention. The measuring device 10 includes a channel unit 20 , a switch unit 30 and a comparison unit 40 . The channel unit 20 is used to connect with an object under test 50 (such as an IC under test), and measure the object u...

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PUM

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Abstract

The present invention provides a measuring device, comprising: N comparators and M channels, each channel is used to connect to one of a plurality of continuous pins of an object under test, and each channel is connected to these comparators respectively One of them is connected, wherein each channel has a switch; wherein, these channels are sequentially divided into groups of N to form at least one channel subgroup, and the channels in each channel subgroup are sequentially connected to The 1st to Nth comparators are connected.

Description

technical field [0001] The present invention relates to a measuring device and its measuring method, in particular to a measuring device and its measuring method suitable for measuring the pin position of an integrated circuit. Background technique [0002] Existing integrated circuit (Integrated circuit, IC) measurement equipment is designed to allow users to arbitrarily arrange the position of the IC to be tested, so each channel (Channel) used to connect IC pins on the measurement equipment is connected to A comparator to facilitate the writing of test programs. However, in practical applications, often only a part of the comparators are used, and the unused comparators remain idle. Therefore, this design often leads to increased cost, larger size, and waste of resources for the measurement equipment. [0003] In view of this, the present invention provides a measuring device and a measuring method to solve the above problems. Contents of the invention [0004] An ob...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2863G01R31/2884
Inventor 蔡佳宏林富仓林亚民
Owner KING YUAN ELECTRONICS