Testing device and method for FPGA chip function

Abstract

The invention belongs to the technical field of FPGA chip function testing, in particular to a testing device and a method for an FPGA chip function capable of reflecting whether the timing simulationresult of the FPGA function is consistent on the logic function of a real FPGA chip. The device comprises a host computer, a PXIe chassis, high-speed digital I/O cards, a PCB, and a to-be-tested FPGAchip. The host computer is connected to the PXIe chassis which has high-speed digital I/O cards inserted therein. The high-speed digital I/O cards communicate with each other through a PXIe bus and are connected to the PCB. A chip package socket is provided in the PCB. The to-be-tested FPGA chip is placed at the chip package socket. A pin parameter setting module used for setting the number of pins of the to-be-tested chip and pin attributes and a configuration module used for setting input and output voltage signals for each channel of the high-speed digital I/O cards are provided in the host computer. The testing device and the method for the FPGA chip function can realize the distributed transmission and acquisition of signals, test multiple chips at one time, and can reflect whether the simulation result of the FPGA function is consistent on the logic function of the real FPGA chip.

Description

technical field [0001] The invention belongs to the technical field of FPGA chip function testing, in particular to an FPGA chip function testing device and method capable of reflecting whether the FPGA function timing simulation results are consistent with the logical functions on the real FPGA chip. Background technique [0002] In order to verify whether the logic function of the FPGA is correct, it is generally confirmed through the FPGA function simulation test, but whether the FPGA logic program can be consistent with the FPGA function simulation test results after being downloaded to the FPGA chip requires an FPGA chip test. function test. Existing information is that Chinese patent CN103472386 has developed a set of chip testing device and method based on FPGA. The feedback signal of the chip to be tested, and the timing of the test results are displayed to the host computer, but it is impossible to test multiple chips at the same time, and the test input timing sig...

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Problems solved by technology

Existing information is that Chinese patent CN103472386 has developed a set of chip testing device and method based on FPGA. The feedback signal of the chip to be tested, and the timing of the test results are displayed to the host computer, but it is impossible to test multiple chips at the same time, and the test input timing signal is limited, and it is impossible to perform all the stimulation of the FPGA functional simulation test, and the test results need to be determined separately. There is also no automatic comparison function between test results and simulation results, and it is impossible to confirm whether the FPGA function simulation results are consistent with the logic functions on the real FPGA chip.

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