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Test method and device and electronic equipment

A test method and a test device technology, which are applied in the computer field, can solve problems such as poor test accuracy, and achieve the effect of improving test accuracy

Inactive Publication Date: 2019-04-02
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the above-mentioned shortcomings of the prior art, the object of the present invention is to provide a test method, device and electronic equipment for solving the problem of poor test accuracy in the prior art

Method used

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  • Test method and device and electronic equipment
  • Test method and device and electronic equipment

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Embodiment Construction

[0053] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0054] see Figure 1 to Figure 7 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, so that only the components related to the present invention are shown in the diagrams rather than the number, shape and Dimensional drawing, the type, quant...

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Abstract

The embodiment of the invention provides a test method, a test device and electronic equipment. The test method comprises the steps of determining a standard read-write data range of a to-be-tested storage system; obtaining test read-write data of a to-be-tested storage system, and counting the jitter number of the test read-write data exceeding the standard read-write data range; and when the jitter number is greater than or equal to a preset threshold, determining that the performance of the to-be-tested storage system is abnormal. According to the test method provided by the embodiment of the invention, the hidden information contained in the test data is captured in a statistical analysis manner, so that the test result can be accurately analyzed, and the test precision is effectivelyimproved.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a testing method, device and electronic equipment. Background technique [0002] In the server market, the performance stability of the server is very important, especially in key industries such as the financial industry or Internet payment platform, the storage subsystem of the server (CPU-RAID card-backplane-disk full link) More and more attention has been paid to the stability of performance. [0003] For the development and testing of server performance stability, testing tools are usually used to evaluate the performance of the storage subsystem of the server, and finally obtain the test results, and then judge whether the server performance is stable according to the test results. However, the inventor found through research that the above test results are usually an average test result, that is, the test result is usually an average calculated value or a qualitative co...

Claims

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Application Information

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IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2257
Inventor 张希伟
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD