A simple SSD power-off test method

A simple and simple technology for power-off test, applied in the field of SSD power-off test and simple SSD power-off test, it can solve the problems of inconvenient deployment, limitation, poor compatibility, etc. Effect
CN109840171APending Publication Date: 2019-06-04SHANDONG SINOCHIP SEMICON
5 Cites 2 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANDONG SINOCHIP SEMICON
Publication Date
2019-06-04

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
Patent Text Reader

Abstract

The invention discloses a simple SSD power-off test method, which comprises the following steps: detecting the voltage change of a controlled host taking an SSD device as a main disk of an operating system, realizing the starting operation of the controlled host through a relay according to the voltage change condition, and realizing the shutdown operation of the controlled host through an upper computer. In the cyclic process of completing login and exit operations of a plurality of machine operation systems, power-on and power-off cyclic operations of the batch SSD storage devices are realized, and automatic execution of startup and shutdown operation application scene tests in the compatibility test of the batch SSD devices is realized. The method does not depend on a WOL function, is not limited by a network or a mainboard, and is convenient to deploy and high in compatibility.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to a method for SSD power-off testing, in particular to a simple SSD power-off testing method, which belongs to the technical field of SSD storage device testing. Background technique

[0002] In the compatibility test of SSD storage devices, there are application test scenarios in which SSD devices are used as the main disk of the operating system to start and shut down, and multiple rounds are required to ensure product quality. Existing test methods rely on WOL functions, are limited by the network or motherboard, are inconvenient to deploy, and have poor compatibility. Contents of the invention

[0003] The technical problem to be solved by the present invention is to provide a simple SSD power-off test method, which does not depend on the WOL function, is not limited to the network or the motherboard, is convenient for deployment, and has strong compatibility.

[0004] In order to solve the technical problems described abo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More