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A simple SSD power-off test method

A simple and simple technology for power-off test, applied in the field of SSD power-off test and simple SSD power-off test, it can solve the problems of inconvenient deployment, limitation, poor compatibility, etc. Effect

Pending Publication Date: 2019-06-04
SHANDONG SINOCHIP SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing test methods rely on WOL functions, are limited by the network or the motherboard, are inconvenient to deploy, and have poor compatibility

Method used

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Embodiment 1

[0014] This embodiment discloses a simple SSD power-off test method, which consists of figure 1 As shown in the schematic diagram, before the test starts, the operating system with the SSD storage device as the main disk is shut down. Preparations that need to be done also include:

[0015] 1. Prepare the GPIO signal interface on the SSD device as the signal source interface (the voltage signal needs to have obvious changes during the system operation phase and shutdown state, and the voltage peak value should not exceed 5V). This GPIO interface is the general-purpose input and output interface of the SSD device. After the power-on system starts normally, the GPIO interface is pulled high, indicating that the system disk is working normally. If the GPIO is not pulled high, the working state of the system disk is abnormal.

[0016] 2. Connect the voltage signal source, Arduino board, relay, and mainboard power on / off interface. The specific connection method is: the analog sig...

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PUM

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Abstract

The invention discloses a simple SSD power-off test method, which comprises the following steps: detecting the voltage change of a controlled host taking an SSD device as a main disk of an operating system, realizing the starting operation of the controlled host through a relay according to the voltage change condition, and realizing the shutdown operation of the controlled host through an upper computer. In the cyclic process of completing login and exit operations of a plurality of machine operation systems, power-on and power-off cyclic operations of the batch SSD storage devices are realized, and automatic execution of startup and shutdown operation application scene tests in the compatibility test of the batch SSD devices is realized. The method does not depend on a WOL function, is not limited by a network or a mainboard, and is convenient to deploy and high in compatibility.

Description

technical field [0001] The invention relates to a method for SSD power-off testing, in particular to a simple SSD power-off testing method, which belongs to the technical field of SSD storage device testing. Background technique [0002] In the compatibility test of SSD storage devices, there are application test scenarios in which SSD devices are used as the main disk of the operating system to start and shut down, and multiple rounds are required to ensure product quality. Existing test methods rely on WOL functions, are limited by the network or motherboard, are inconvenient to deploy, and have poor compatibility. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a simple SSD power-off test method, which does not depend on the WOL function, is not limited to the network or the motherboard, is convenient for deployment, and has strong compatibility. [0004] In order to solve the technical problems described abo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 王璞刘正主李铁宗成强
Owner SHANDONG SINOCHIP SEMICON
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