Power supply protection circuit and test device
A power protection and circuit technology, applied in the direction of overload protection devices, etc., can solve the problems of increasing the current of the test device, property loss, burning out the test device, etc., and achieve the effect of improving efficiency and safety
Active Publication Date: 2019-06-21
KUSN INFOVISION OPTOELECTRONICS
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Problems solved by technology
However, during the test, if the tester forgets to switch the switch to the off position after the test is over, it will cause a large current at the DC power supply when the tester connects the test device to the DC power supply in the next test. Instantly increase the current in the test device, burn out the test device, and cause property damage
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[0022] Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings. In the various figures, identical elements are indicated with similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale. Also, some well-known parts may not be shown in the drawings.
[0023] In the following, many specific details of the present invention, such as structures, materials, dimensions, processes and techniques of components, are described for a clearer understanding of the present invention. However, the invention may be practiced without these specific details, as will be understood by those skilled in the art.
[0024] It should be understood that in the following description, a "circuit" refers to a conductive loop formed by at least one element or sub-circuit through electrical or electromagnetic connections. When an element or circuit is said to be "connected to" another element or an...
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The invention discloses a power supply protection circuit and a test device. The power supply protection circuit comprises a relay, a control module and a switch detection module, wherein the relay includes a power end, a power supply end, and a current path between the power end and the power supply end; when the current path is conducted, the power end provides a direct voltage to the power supply end; when the current path is turned off, the power supply end is suspended; the control module controls the conduction and shutoff of the current path according to a switch control signal; the switch detection module includes a first connection path and a second connection path; and when the power end is electrified, the invalid switch control signal is provided to turn off the current path via one of the first connection path and the second connection path, and the effective switch control signal is provided to conduct the current path when the other of the first connection path and the second connection path is conducted. A phenomenon that a tester forgets to switch the switch to a turn-off gear after a test is finished so that a load is burnt in a subsequent test can be avoided, andtest efficiency and safety are improved.
Description
technical field [0001] The invention relates to the technical field of power supply protection, and more particularly relates to a power supply protection circuit and a testing device. Background technique [0002] In the production process of the existing electronic equipment, it is necessary to test each module in the electronic equipment, for example, to test the power-on status of each module. Usually, a DC power supply is used to supply power to the test device during testing, and a switch is connected between the DC power supply and the test device to control the on-off of the power supply. However, during the test, if the tester forgets to switch the switch to the off position after the test is over, it will cause a large current at the DC power supply when the tester connects the test device to the DC power supply in the next test. Instantly increase the current in the test device, burn out the test device, and cause property damage. Contents of the invention [...
Claims
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IPC IPC(8): G01R1/36
Inventor 马志鹏王博乔向洋蒋敏
Owner KUSN INFOVISION OPTOELECTRONICS