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A power supply protection circuit and testing device

A power protection and circuit technology, applied in the direction of overload protection devices, etc., can solve the problems of increasing the current of the test device, burning the test device, property loss, etc., to achieve the effect of improving efficiency and safety

Active Publication Date: 2021-08-06
KUSN INFOVISION OPTOELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, during the test, if the tester forgets to switch the switch to the off position after the test is over, it will cause a large current at the DC power supply when the tester connects the test device to the DC power supply in the next test. Instantly increase the current in the test device, burn out the test device, and cause property damage

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  • A power supply protection circuit and testing device
  • A power supply protection circuit and testing device
  • A power supply protection circuit and testing device

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Embodiment Construction

[0022] Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings. In the various figures, identical elements are indicated with similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale. Also, some well-known parts may not be shown in the drawings.

[0023] In the following, many specific details of the present invention, such as structures, materials, dimensions, processes and techniques of components, are described for a clearer understanding of the present invention. However, the invention may be practiced without these specific details, as will be understood by those skilled in the art.

[0024] It should be understood that in the following description, a "circuit" refers to a conductive loop formed by at least one element or sub-circuit through electrical or electromagnetic connections. When an element or circuit is said to be "connected to" another element or an...

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Abstract

The invention discloses a power supply protection circuit and a test device. The power supply protection circuit comprises: a relay, including a power supply terminal, a power supply terminal and a current path between the power supply terminal and the power supply terminal. When the current path is turned on, the power supply terminal supplies power to the The terminal provides a DC voltage, and when the current path is turned off, the power supply terminal is suspended; the control module controls the conduction and shutdown of the current path according to the switch control signal; and the switch detection module includes a first connection path and a second connection path, An inactive switch control signal is provided via one of the first and second communication paths to turn off the current path when the power supply terminal is powered on, and when the other of the first and second communication paths is turned on Provide an effective switch control signal to make the current path conduction, which can avoid the phenomenon of burning out the load in the subsequent test due to the tester forgetting to switch the switch to the off position after the end of the test, improving the test efficiency and safety sex.

Description

technical field [0001] The invention relates to the technical field of power supply protection, and more particularly relates to a power supply protection circuit and a testing device. Background technique [0002] In the production process of the existing electronic equipment, it is necessary to test each module in the electronic equipment, for example, to test the power-on status of each module. Usually, a DC power supply is used to supply power to the test device during testing, and a switch is connected between the DC power supply and the test device to control the on-off of the power supply. However, during the test, if the tester forgets to switch the switch to the off position after the test is over, it will cause a large current at the DC power supply when the tester connects the test device to the DC power supply in the next test. Instantly increase the current in the test device, burn out the test device, and cause property damage. Contents of the invention [...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/36
Inventor 马志鹏王博乔向洋蒋敏
Owner KUSN INFOVISION OPTOELECTRONICS