Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A contact type linear stress sensor and its stress detection method

A stress sensor and stress detection technology, which is applied in the measurement, instrumentation, and measurement force of the change force of the optical properties of the material when it is stressed, can solve the problems of light source attenuation, wavelength drift, and light source change in the measurement results.

Inactive Publication Date: 2021-06-15
SHANDONG UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, in the military field, such as the control and monitoring of stress in aerospace equipment, aircraft and other fields, the marine field and health status monitoring and other fields, higher requirements are placed on the performance of stress sensors, especially in order to meet social needs. The requirements for accuracy, sensitivity, and stability are getting higher and higher. At present, the sensors used to measure stress include fiber grating stress sensors, silicon-based optical MEMS pressure sensors, capacitive stress sensors, and resonant stress sensors. The optical sensor in the sensor is easily affected by the change of the light source. For example, the measurement results of the commonly used Mach-Zehnder (M-Z) interferometric optical pressure sensor are greatly affected by the attenuation of the light source, wavelength drift, etc.; the silicon-based optical MEMS pressure sensor mainly passes the output light intensity. The change of the pressure is used to detect the size of the pressure, but the relationship between the pressure and the light intensity is nonlinear, so the sensor is nonlinear

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A contact type linear stress sensor and its stress detection method
  • A contact type linear stress sensor and its stress detection method
  • A contact type linear stress sensor and its stress detection method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0054] A contact-type linear stress sensor based on an arrayed waveguide grating structure, such as Figure 4 As shown, it includes an optical signal input module 11, an arrayed waveguide grating, and a spectral detection module 12 connected in sequence; the wide-spectrum optical signal input module 11 integrates a broadband halogen fiber optic illuminator, and its function is to provide a wide-spectrum light source for the sensor and detect spectral signals. A small CCD spectrometer is integrated inside the module 12, and its function is to detect the drift of the arrayed waveguide grating output spectrum;

[0055] The optical signal input module 11 is used to provide a wide-spectrum optical signal for stress detection, the arrayed waveguide grating is the contact area of ​​the force-applying object, and the spectrum detection module 12 is used to detect the wavelength of the output signal.

Embodiment 2

[0057] According to the contact type linear stress sensor based on the arrayed waveguide grating structure described in Embodiment 1, the difference is that:

[0058] Such as figure 2 , image 3 As shown, the arrayed waveguide grating includes an input channel 7, an input slab waveguide 8, several single-mode waveguides 6, an output slab waveguide 9, and an output channel 10 connected in sequence; an optical signal input module 11 is connected to the input channel 7, and the output channel 10 is connected to the spectral A detection module 12; both ends of each single-mode waveguide 6 are respectively connected to the input slab waveguide 8 and the output slab waveguide 9;

[0059] The array area composed of several single-mode waveguides 6 is packaged into a rectangular area, which is used as the refractive index sensitive area 5, that is, the stress contact detection area;

[0060] The refractive index sensitive area 5 is the contact area of ​​the force-applying object. ...

Embodiment 3

[0070] According to the contact type linear stress sensor based on the arrayed waveguide grating structure described in Embodiment 2, the difference is that the width of the single-mode waveguide 6 is 2 μm, and the thickness of the single-mode waveguide 6 is 1 μm.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention relates to a contact type linear stress sensor based on an arrayed waveguide grating structure and a stress detection method thereof, comprising an input channel, an input slab waveguide, an arrayed waveguide grating composed of a specific number of single-mode waveguides, an output slab waveguide, and an output channel; For the waveguide grating, the rectangular area to which the specific single-mode waveguide that constitutes it belongs is used as the refractive index sensitive area, that is, the stress contact detection area. The contact type linear stress sensor of the present invention cleverly utilizes the wavelength-sensitive demultiplexing characteristic of the arrayed waveguide grating (AWG), that is, the change of the effective refractive index of the core layer of the waveguide brings about the change of the phase difference of light of different wavelengths in the adjacent waveguide. After the channel waveguide is output, the effective refractive index of different waveguide core layers corresponds to different central wavelengths, realizing the stress detection function of the device.

Description

technical field [0001] The invention relates to a contact type linear stress sensor based on an arrayed waveguide grating structure and a stress detection method thereof, belonging to the technical field of stress detection. Background technique [0002] With the advancement and development of science and technology, the application of sensing technology is becoming more and more common. As a way of collecting information, it is widely used in various fields, and has now become an important symbol to measure the development level of a country's science and technology. Among them, the stress sensor, as the most commonly used sensor, is widely used in various industrial self-control environments, involving water conservancy and hydropower, railway transportation, intelligent buildings, production self-control, aerospace, military industry, petrochemical, oil wells, electric power, ships, machine tools, pipelines, oceans, etc. industries and fields. [0003] At present, in the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01L1/24
CPCG01L1/241
Inventor 季伟卢文朔尹锐黄庆捷李景垚
Owner SHANDONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products