An x-ray single-exposure dual-energy microscopic imaging device

Abstract

The invention provides a single-exposure X-ray dual-energy microscopic imaging system, which is characterized in that it includes an X-ray dual-energy conversion device and a spectroscopic microscopic imaging device. Wherein, the X-ray dual-energy conversion device includes: a pre-filter layer for pre-filtering some extremely low-energy X-rays, the pre-filter layer is made of tin; a multi-layer composite scintillation sheet, the multi-layer composite scintillation sheet includes , the first scintillation sheet is used to absorb low-energy X-rays in polychromatic X-rays and generate the first scintillation light; the filter layer is used to filter the remaining low-energy X-rays; the second scintillator sheet is used to absorb polychromatic X-rays high-energy X-rays and generate second scintillation light, wherein the central wavelength difference between the second scintillation light and the first scintillation light is relatively large, so that the spectroscopic device can separate the two scintillation lights.

Description

technical field [0001] The invention relates to the field of radiation imaging, in particular to a single-exposure X-ray dual-energy microscopic imaging device Background technique [0002] In the field of non-contact detection, X-ray imaging detection is an important technical means, which is used in security inspection, medical diagnosis, industrial flaw detection, container detection and other fields, and is widely used in stations, hospitals, docks and other places. [0003] X-rays have penetrating ability, and can penetrate the interior of the object without contact, thereby imaging the interior of the object. [0004] In single-energy X-ray detection technology, since only the attenuation value of a substance to a single X-ray can be used to identify a substance, and different substances may show the same attenuation value under the same X-ray penetration, so this technology can be used under certain conditions. It is difficult to classify and identify the substance. ...

AI Technical Summary

Problems solved by technology

[0009] For the above-mentioned dual-source dual-detector system, since the system is actually composed of two traditional single-energy detection systems, and the two subsystems collect data independently, the system requires high alignment requirements for hardware installation. Generally speaking, this type of The spatial matching between high-energy data and low-energy data of the system is poor

In the fast kilovolt switching detection system, due to the rapid switching of the voltage of the ray source, it is difficult to switch the high-Z filter on the detection path synchronously when detecting high-energy X-rays. Therefore, when the system is collecting high-energy data , the detected X-rays also contain a large number of low-energy rays, so the X-ray spectra corresponding to the high-energy data and low-energy data of the system overlap seriously

The above two dual-energy detection systems also have the problem of poor time matching, in which the high-energy and low-energy data of the dual-source dual-detector system differ in time by the time corresponding to 1 / 4 of the scan, and the fast kilovolt switching The scan time when the high-energy and low-energy data of the detection system are separated in time by an angle

In the above two detection systems, the object to be inspected is required to collect dual-energy data under the irradiation of X-rays of different energies, so the X-ray radiation dose received by the object to be inspected is relatively large.

Images