Test data generation method and device, computer device and storage medium

A test data and data generation technology, applied in the field of big data, can solve problems such as poor versatility and inability to meet the testing requirements of different software systems, and achieve the effect of good versatility and improved testing efficiency.

Pending Publication Date: 2019-08-30
PING AN TECH (SHENZHEN) CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of this, an embodiment of the present invention provides a test data generation method, device, computer equipment, and storage medium to solve the problem that existing test data generation tools can only generate test data files in a single format, resulting in poor versatility. Problems that cannot meet the testing requirements of different software systems

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  • Test data generation method and device, computer device and storage medium
  • Test data generation method and device, computer device and storage medium
  • Test data generation method and device, computer device and storage medium

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Embodiment Construction

[0045] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention.

[0046] The appearances of the phrase "an embodiment" in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is understood explicitly and implicitly by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0047] Embodiments of the present invention provide a method for generating test data, which is applied to perform...

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Abstract

The invention belongs to the technical field of big data, and relates to a test data generation method and device, a computer device and a storage medium. The method comprises: receiving a test data generation request; confirming the output format type of the generated test data and the generation amount of the test data according to the test data generation request; obtaining configuration information and user-defined field configuration information of each field used for generating test data according to the output format category, and generating a test data file based on the configuration information, the user-defined field configuration information and the generation amount of the test data, wherein the format of the test data file corresponds to the output format type. According to the scheme provided by the invention, a large amount of test data can be automatically generated, the test efficiency can be effectively improved, different types of test data can be generated for different test scenes or different software systems, test data files of different formats can be output, the test requirements of different test scenes or different software systems can be met, and the universality is good.

Description

technical field [0001] The embodiments of the present invention belong to the technical field of big data, and in particular relate to a test data generation method, device, computer equipment, and storage medium. Background technique [0002] Software performance testing is very important to ensure the response speed, reliability and stability of software operation. In software performance testing, it is often necessary to upload tens of thousands or even hundreds of thousands of test data. [0003] In the process of generating test data, due to the correlation of data fields, input restrictions, etc., generating hundreds of thousands of test data is a very complicated and time-consuming work, and the test data has different field contents on different software platforms, which is complex. The utilization rate is low, and testers will spend a lot of time in the process of writing test data for one or more software platforms, which affects test efficiency. [0004] In addit...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F17/21G06F17/24
CPCG06F11/3684G06F40/103G06F40/186
Inventor 杨雨晨
Owner PING AN TECH (SHENZHEN) CO LTD
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