Power supply aging test system and method
A technology of aging test and power supply, applied in the field of aging test system of power supply, it can solve the problems of many isolation modules, complicated wiring and high cost, and achieve the effect of reducing the number of loops, reducing hardware cost and improving test efficiency.
Pending Publication Date: 2019-09-06
深圳市鼎泰佳创科技有限公司
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[0004] but, figure 1 Each output in the aging test system shown requires a booster module, which is expensive, and the efficiency of boosting to the specified voltage is low, and the wiring is more complicated; figure 2 In the aging test system shown, only the main output can be connected in series, and the remaining outputs can only be tested with isolated modules, which also has the problem of low efficiency, and more isolation modules are required, and the cost is higher
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[0039] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.
[0040]Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used herein in the description of the application are only for the purpose of describing specific embodiments, and are not intended to limit the application. It can be understood that the terms "first", "second" and the like used in this application may be used to describe various elements herein, but these elements are not limited by these terms. These terms...
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The invention discloses a power supply aging test system and a power supply aging test method. The power supply aging test system comprises a test device, wherein the test device is provided with a plurality of products to be tested, and each of the products to be tested comprises at least two paths of power supply outputs; the plurality of products to be tested are arranged in a matrix accordingto rows and columns, one path of power supply outputs of the products to be tested in each row in the matrix are sequentially connected in series to form one path of series output loop, one path of power supply outputs of the products to be tested in each column in the matrix are sequentially connected in series to form one path of series output loop, and each of the one path of series output loops is electrically connected with an aging test load, so as to form an aging test of the one path of series output loops. By adopting the power supply aging test system, the test efficiency of the aging test of the power supply can be improved, and the cost can be reduced.
Description
technical field [0001] The invention relates to the field of product aging testing, in particular to an aging testing system and method for a power supply. Background technique [0002] Aging test refers to the process of carrying out corresponding condition strengthening experiments on the aging of the product due to various factors involved in the actual use conditions of the product, such as burning the power supply for a long time by simulating the test environment under high temperature and harsh conditions , to improve product safety, stability and reliability. [0003] When performing batch aging tests on products to be tested through aging test cabinets or aging test rooms, for different numbers of power supplies with multiple outputs (greater than or equal to two outputs), traditional aging test systems such as figure 1 and figure 2 shown. in, figure 1 The shown burn-in test system uses a parallel connection method for the output of multiple power supplies. Eac...
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CPCG01R31/40
Inventor 梁远文黄维何富荣
Owner 深圳市鼎泰佳创科技有限公司