Low-illumination electronic speckle interference fringe image enhancement method

An electronic speckle interference and fringe image technology, applied in image enhancement, image data processing, instruments, etc., can solve the problems of low illumination, fringe resolution and contrast effect, strong granular noise, etc., to achieve good enhancement effect, fringe Complete, extraction-friendly and phase-unwrapping effects

Pending Publication Date: 2019-09-06
TIANJIN UNIV
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Problems solved by technology

[0003] Although the electronic speckle interferometry technology has many excellent characteristics, the electronic speckle fringe images obtained in the experiment are often accompanied by strong granular noise, and there will be a phenomenon of low illumination, which reduces the clarity of the image. The resolution and contrast of fringes are affected, which in turn will affect the results of electronic speckle interferometry and the final measurement accuracy, and bring great challenges to the extraction of fringe skeleton lines and phase development.

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  • Low-illumination electronic speckle interference fringe image enhancement method
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  • Low-illumination electronic speckle interference fringe image enhancement method

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Embodiment Construction

[0030] Next, the low-illuminance electronic speckle interference fringe image enhancement method based on the Retinex theory proposed by the present invention is applied for enhancement. Specific steps are as follows:

[0031] Step 1: Conduct experiments to obtain low-light experimental images. According to the density characteristics of the electronic speckle interference fringe image, experiments are carried out to obtain low-density, high-density and variable-density electronic speckle interference fringe images.

[0032] Step 2: Construct the Retinex theoretical model. Specific steps are as follows:

[0033] Step 2-1: First, according to the Retinex theory, use the logarithm method to separate the irradiation component and the reflection component, namely:

[0034] logS(x,y)=logR(x,y)+logL(x,y)

[0035] Among them, S represents the image we see, L is the incident light image, and R is the reflective property of the object. Retinex uses the image S to obtain the reflec...

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Abstract

The invention belongs to the technical field of optical detection and image processing, and aims to realize contrast enhancement of an electronic speckle interference image with low illumination, andstripes after image binaryzation can be kept complete as much as possible, so that extraction is more accurate when skeleton lines are extracted subsequently. The technical scheme adopted by the invention is as follows: the low-illumination electronic speckle interference fringe image enhancement method comprises the following steps of selecting a multi-scale Retinex algorithm (multi-scale retinex, MSR) based on center encircling by utilizing a Retinex theory. The low-quality low-illumination electronic speckle interference fringe image enhancement method is mainly applied to optical detection and image processing occasions, and can be used for processing low-quality low-illumination electronic speckle interference fringe images obtained through experiments, adjusting scale parameters andobtaining an optimal result.

Description

technical field [0001] The invention belongs to the technical field of optical detection and image processing, and relates to an electronic speckle interference fringe image enhancement method based on the Retinex theory. Background technique [0002] Electronic Speckle Pattern Interferometry (ESPI for short) measurement technology is a modern optical measurement technology. It has the advantages of full-field non-contact, high precision and high sensitivity, and is not protected from light. It is widely used in the measurement of optical rough surfaces. Deformation measurement and non-destructive testing. When the workpiece under test has a small displacement, the speckle pattern formed on its surface will also move. The speckle pattern is recorded by optical photography, and the two speckle images collected before and after deformation are absolutely analyzed. The speckle fringe pattern corresponding to the deformation information can be obtained by subtracting, adding or...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/40
CPCG06T5/40
Inventor 唐晨胡一冰
Owner TIANJIN UNIV
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