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Information entropy additive fuzzy defect feature analysis reconstruction method based on infrared thermal imaging

A technology of infrared thermal imaging and feature analysis, used in image analysis, image data processing, character and pattern recognition, etc.

Active Publication Date: 2019-09-06
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the traditional FCM algorithm cannot completely express the characteristics of each element, and many useful pixel features will be lost during the processing of defect information in different spaces and in different degrees. In order to solve this kind of problem, the present invention proposes a new objective function, including It not only improves the information of feature elements, but also handles the mutual interference between different degrees of defects.

Method used

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  • Information entropy additive fuzzy defect feature analysis reconstruction method based on infrared thermal imaging
  • Information entropy additive fuzzy defect feature analysis reconstruction method based on infrared thermal imaging
  • Information entropy additive fuzzy defect feature analysis reconstruction method based on infrared thermal imaging

Examples

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Embodiment

[0065] figure 1 It is a flow chart of the method for analyzing and reconstructing the characteristics of the fuzzy defects based on the information entropy additive of the present invention based on infrared thermal imaging.

[0066] In this example, if figure 1 As shown, an information entropy additive fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging in the present invention mainly includes three steps: S1, preprocessing of the video stream to be detected; S2, defect reconstruction; S3, reconstructed image feature extraction;

[0067] Below we combine the above three steps to describe in detail.

[0068] S1. Preprocessing of the video stream to be detected

[0069] S1.1, the video stream to be detected is represented by a matrix block as: Among them, N I ×N J represents spatial information, N T Represent time information;

[0070] S1.2, convert the matrix block into a two-dimensional matrix Y through the vector operator Vec();...

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Abstract

The invention discloses an information entropy additive fuzzy defect feature analysis reconstruction method based on infrared thermal imaging, and the method comprises the steps: carrying out the extraction and feature analysis of defects of different spatial indegrees through a reconstruction model and an optimized fuzzy algorithm, and enabling the defect features of different spatial indegrees to be accurately divided; meanwhile, in the optimized fuzzy algorithm, constructing novel target functions. One part comprises the sum of the sponsousness and the hesitance; feature information of elements is enriched; the other part comprises fuzzy entropy; the uncertainty of the feature information is described; the method provides effective help for the distinguishing of defects, such design andconstruction have good stability and high efficiency, have outstanding effects on the description of defect characteristic textures and the representation of characteristic chromatic aberration, andcan reasonably and accurately evaluate and analyze different degrees of defects in different spaces.

Description

technical field [0001] The invention belongs to the technical field of defect detection, and more specifically relates to an information entropy additive fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging. Background technique [0002] In recent years, infrared thermal imaging detection technology has developed rapidly. It does not damage the body, is fast and efficient, and can effectively solve the problems of traditional nondestructive testing methods such as high labor intensity, long cycle, low efficiency, and poor safety, and realize large-area rapid detection and save a lot of manpower and material resources. [0003] If there are defects on the surface of the test piece to be tested, it will affect its heat distribution. The test piece to be tested is heated to form a high-temperature zone and a low-temperature zone. Due to the difference in temperature, the heat in the high-temperature zone is transferred to the low-temperatur...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T7/40G06T7/90G06K9/62G06F17/16
CPCG06T7/0002G06T7/40G06T7/90G06F17/16G06F18/2321
Inventor 程玉华殷春黄雪刚张博张昊楠薛婷石安华
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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