Intelligent equipment aging test method and equipment

A smart device and aging test technology, applied in the computer field, can solve the problem that the test time cannot be adjusted

Active Publication Date: 2019-09-27
SHANGHAI LONGCHEER TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] One purpose of this application is to provide a method and equipment for smart device aging testing, which solves the problem that the functional stabilit

Method used

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  • Intelligent equipment aging test method and equipment
  • Intelligent equipment aging test method and equipment
  • Intelligent equipment aging test method and equipment

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Embodiment Construction

[0060] The application will be described in further detail below in conjunction with the accompanying drawings.

[0061] In a typical configuration of the present application, the terminal, the device serving the network and the trusted party all include one or more processors (CPUs), input / output interfaces, network interfaces and memory.

[0062] Memory may include non-permanent storage in computer readable media, in the form of random access memory (RAM) and / or nonvolatile memory such as read only memory (ROM) or flash RAM. Memory is an example of computer readable media.

[0063] Computer-readable media, including both permanent and non-permanent, removable and non-removable media, can be implemented by any method or technology for storage of information. Information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random acce...

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Abstract

The application aims to provide an intelligent equipment aging test method and equipment, wherein the method comprises the following steps: a confirmation instruction of a user to a test mode is obtained, the used test mode is determined according to the confirmation instruction of the test mode, wherein the used test mode comprises a developer mode and a non-developer mode; a target test item of the intelligent equipment is determined according to the used test mode, and the target test item of the intelligent equipment is tested; data information in the test process is recorded and stored, a test result is counted and displayed according to the data information, and the test result is displayed, wherein the data information comprises a test failure occurrence reason and test failure occurrence time; and the number of turns of test success and the number of turns of test failure are counted. Therefore, the intelligent equipment with different configurations can be self-defined in the function stability test and the aging test of the intelligent equipment; and compared with the prior art, all items needing to be tested can be covered in a shorter time, and enough test pressure is achieved.

Description

technical field [0001] The present application relates to the field of computers, in particular to a method and equipment for aging testing of intelligent equipment. Background technique [0002] In the production process of smart devices, it is a very important step to perform aging tests and functional stability tests on devices, and it has very important practical significance for the quality monitoring of smart devices. In the existing technology, the functional stability test and aging test of smart devices are usually tested with fixed test items and fixed test sequences, and the test time is not adjustable. When such a test scheme is applied to different smart device systems for testing It is time-consuming and labor-intensive to design and test the process individually for each system. Contents of the invention [0003] One purpose of this application is to provide a method and equipment for smart device aging testing, which solves the problem that the functional ...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 邱永伟孟旭杜军红汤肖迅
Owner SHANGHAI LONGCHEER TECH CO LTD
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