Crop yield prediction method and system

A yield prediction and crop technology, applied in the field of crop management, can solve problems such as the inability to fully reflect the impact of yield, and achieve the effect of improving the accuracy of yield estimation

Active Publication Date: 2019-10-08
BEIJING NORMAL UNIVERSITY
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Problems solved by technology

These models are simple and easy to implement, and have achieved good results, but they ignore the influence of historical trends on yield, and the meteorological factors only

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  • Crop yield prediction method and system
  • Crop yield prediction method and system

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Embodiment Construction

[0059] The object of the present invention is to provide a crop yield prediction method and system, so as to realize the yield estimation of winter wheat in the whole growth period from a more comprehensive perspective, and improve the yield estimation accuracy of winter wheat.

[0060] In order to make the above objects, features and advantages of the present invention more comprehensible, the invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0061] This study considers that the final yield of crops is affected by climate conditions, soil properties, crop seed genetics, field management, and policy-oriented factors. It uses a relatively simple statistical method to comprehensively consider the relationship between social factors, natural factors and winter wheat yield. The result of the trend model is used as the basis for yield change, and the climate index and enhanced vegetation index (EVI) retrieve...

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Abstract

The invention provides a crop yield prediction method. The prediction method comprises the following steps: firstly, establishing a comprehensive yield assessment model containing an unknown coefficient based on a trend yield model, a comprehensive climate index model and a growth key period (EVI), and then solving the unknown coefficient in the comprehensive yield assessment model containing theunknown coefficient by utilizing historical data to obtain a comprehensive yield assessment model; and finally, obtaining meteorological data and EVI data of a target yield assessment year, inputtingthe meteorological data and the EVI data into the comprehensive yield assessment model, and predicting the yield of the target yield assessment year. The comprehensive yield estimation model based onthe trend yield, the comprehensive climate index and the growth key period EVI is constructed, so that the yield estimation of the winter wheat in the whole growth period is realized from a more comprehensive perspective, and the yield estimation precision of the winter wheat is improved.

Description

technical field [0001] The invention relates to the field of crop management, in particular to a crop yield prediction method and system. Background technique [0002] Wheat is one of the three major food crops in the world, and its output is directly related to the food security of various countries. Therefore, the monitoring and management of the wheat growth environment and process have always been the focus of scholars in various countries. An important reference for government decision-making management, resource regulation and even grain trade. [0003] At present, there are mainly four methods of wheat yield estimation: agronomic yield estimation, agrometeorological yield estimation, remote sensing yield estimation and mixed yield estimation. [0004] Agronomic yield estimation is to build a simulation model of crop growth, namely crop model, by simulating the factors affecting the growth of different crop varieties such as water, soil, and climate. The crop model is...

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Application Information

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IPC IPC(8): G06Q10/04G06Q50/02
CPCG06Q10/04G06Q50/02Y02A90/10
Inventor 潘耀忠夏兴生王凯姬忠林
Owner BEIJING NORMAL UNIVERSITY
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