A rice yield estimation method based on multi-source vegetation parameters in key phenological periods

A phenological period and rice technology, applied in the field of rice yield estimation based on multi-source vegetation parameters in key phenological periods, can solve the problems of large uncertainty factors, lack of timeliness and high precision, etc., achieve a simple and easy method, and improve yield estimation efficiency , The effect of improving the accuracy of production estimation

Active Publication Date: 2022-07-22
FUZHOU UNIV
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Problems solved by technology

However, since the formation of crop yield is affected by many factors such as solar radiation, soil fertility level, and temperature and humidity conditions, there are relatively large uncertainties in the results of agricultural remote sensing yield estimation.
At the same time, the lack of time-sensitive and high-precision detailed crop distribution data also brings challenges to large-scale crop yield estimation

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  • A rice yield estimation method based on multi-source vegetation parameters in key phenological periods
  • A rice yield estimation method based on multi-source vegetation parameters in key phenological periods
  • A rice yield estimation method based on multi-source vegetation parameters in key phenological periods

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Embodiment Construction

[0027] The technical solutions of the present invention will be described in detail below with reference to the accompanying drawings.

[0028] Please refer to figure 1 The present invention provides a method for estimating rice yield based on multi-source vegetation parameters in key phenological periods, comprising the following steps:

[0029] Step S01: Establish a time series dataset of vegetation and climate parameters in the study area.

[0030] The MOD09A1 band reflectance data was maximized and synthesized at a distance of 500 meters for 8 days, the near-infrared band reflectance data NIRt was extracted, and the MODIS NDVI, EVI, LSWI and NIRv were calculated. Based on the time series data obtained by cloud-free daily calculation, the daily MODIS EVI, LSWI and NIRv time series datasets in the study area in 2017 were obtained by using the linear interpolation method. Then, using the WhittakerSmoother data smoothing method, the smoothed 2017 daily MODIS EVI, LSWI and NI...

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Abstract

The invention relates to a rice yield estimation method based on multi-source vegetation parameters in key phenological periods. The method firstly extracts the rice distribution area based on the ratio index of water body and vegetation index. For the rice planting area, the key phenological stages such as jointing stage, heading stage and maturity stage of rice are obtained pixel by pixel, and then the booting stage and grain filling stage of rice are determined. Based on the accumulation of multiple vegetation parameters in the booting stage and grain filling stage, and taking into account the influence of precipitation at the heading stage, a rice yield estimation model was established. The method of the invention has the advantages of good spatiotemporal continuity, strong robustness, low cost, simple and easy use, and is suitable for large-scale rice yield estimation.

Description

technical field [0001] The invention belongs to the technical field of crop growth monitoring, and relates to a method for estimating crop yield, in particular to a method for estimating rice yield based on multi-source vegetation parameters in key phenological periods. Background technique [0002] People rely on food as their priority, and information on crop planting area and output has always been a major issue related to the national economy and people's livelihood. Traditional agricultural yield estimation methods are slow and labor-intensive, making it difficult to quickly obtain large-scale crop yield information. With the development of remote sensing technology, important progress has been made in agricultural remote sensing yield estimation by establishing the relationship between crop spectrum and yield. However, since the formation of crop yield is affected by various factors such as the amount of solar radiation, soil fertility level, and temperature and humid...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06Q50/02G01N21/31G06F111/10
Inventor 邱炳文张珂李海文
Owner FUZHOU UNIV
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