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Method and system for predicting crop yield

A technology of yield forecasting and forecasting method, applied in the field of crop management, can solve the problem of not being able to fully reflect the impact of yield, and achieve the effect of improving the accuracy of yield estimation

Active Publication Date: 2022-05-03
BEIJING NORMAL UNIVERSITY
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Problems solved by technology

These models are simple and easy to implement, and have achieved good results, but they ignore the influence of historical trends on yield, and the meteorological factors only select a few periods with high correlation, which cannot fully reflect the impact of changes in meteorological elements in the whole growth period of winter wheat. yield impact

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  • Method and system for predicting crop yield
  • Method and system for predicting crop yield

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Embodiment Construction

[0059] The object of the present invention is to provide a crop yield prediction method and system, so as to realize the yield estimation of winter wheat in the whole growth period from a more comprehensive perspective, and improve the yield estimation accuracy of winter wheat.

[0060] In order to make the above objects, features and advantages of the present invention more comprehensible, the invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0061] This study considers that the final yield of crops is affected by climate conditions, soil properties, crop seed genetics, field management, and policy-oriented factors. It uses a relatively simple statistical method to comprehensively consider the relationship between social factors, natural factors and winter wheat yield. The result of the trend model is used as the basis for yield change, and the climate index and enhanced vegetation index (EVI) retrieve...

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Abstract

The present invention provides a crop yield forecasting method. In the forecasting method, first, a comprehensive yield estimation model including unknown coefficients based on a trend yield model, a comprehensive climate index model and EVI during a critical growth period is established, and then the historical data is used to solve the Including the unknown coefficients in the comprehensive production estimation model of unknown coefficients, the comprehensive production estimation model is obtained; finally, the meteorological data and EVI data of the target production estimation year are obtained, and the meteorological data and the EVI data are input into the comprehensive production estimation model to predict the target Estimated production year. The present invention constructs a comprehensive yield estimation model based on trend yield, comprehensive climate index and EVI in critical growth period, so as to realize the yield estimation of winter wheat in the whole growth period from a more comprehensive perspective, and improve the yield estimation accuracy of winter wheat.

Description

technical field [0001] The invention relates to the field of crop management, in particular to a crop yield prediction method and system. Background technique [0002] Wheat is one of the three major food crops in the world, and its output is directly related to the food security of various countries. Therefore, the monitoring and management of the wheat growth environment and process have always been the focus of scholars in various countries. An important reference for government decision-making management, resource regulation and even grain trade. [0003] At present, there are mainly four methods of wheat yield estimation: agronomic yield estimation, agrometeorological yield estimation, remote sensing yield estimation and mixed yield estimation. [0004] Agronomic yield estimation is to build a simulation model of crop growth, namely crop model, by simulating the factors affecting the growth of different crop varieties such as water, soil, and climate. The crop model is...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/04G06Q50/02
CPCG06Q10/04G06Q50/02Y02A90/10
Inventor 潘耀忠夏兴生王凯姬忠林
Owner BEIJING NORMAL UNIVERSITY
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