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Method for predicting behind-target fragment quality after cavity-containing variable cross-section EFP vertical penetration of target panel

A technology of variable cross-section and target plate, applied in the direction of target, target indication system, instrument, etc., can solve the problem of not considering the cavity-containing characteristics of EFP

Inactive Publication Date: 2019-11-12
NANJING UNIV OF SCI & TECH
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  • Abstract
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  • Claims
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Problems solved by technology

Xing Boyang proposed a model for calculating the mass of EFP fragments after vertically penetrating the target with variable cross-section characteristics in the article "Fragment Mass Model after EFP Vertically Penetrating the Target". Mass has a big impact, but this method does not take into account the cavity-containing characteristics of EFP

Method used

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  • Method for predicting behind-target fragment quality after cavity-containing variable cross-section EFP vertical penetration of target panel
  • Method for predicting behind-target fragment quality after cavity-containing variable cross-section EFP vertical penetration of target panel
  • Method for predicting behind-target fragment quality after cavity-containing variable cross-section EFP vertical penetration of target panel

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Embodiment 1

[0072] The present invention will be further introduced below in conjunction with the accompanying drawings and specific implementation cases. Obviously, the described implementation case is only a specific implementation case of the present invention, and all other The implementation cases all belong to the protection scope of the present invention.

[0073] The implementation case of the present invention discloses a method for predicting the quality of fragments after the EFP with variable cross-section containing a cavity is penetrating the target plate target as follows:

[0074] Step 1, according to figure 2 The shape and scale of an EFP in , get the r of an EFP i and l i The mathematical relationship of the i+1 -l i <<l. The material parameters of EFP and target plate are shown in Table 1.

[0075] Table 1 Material parameters and initial conditions of an EFP and target plate

[0076]

[0077]

[0078] According to Newton's second law, establish a calculati...

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Abstract

The invention discloses a method for predicting the behind-target fragment quality after a cavity-containing variable cross-section EFP vertical penetration of a target panel, and provides the methodfor calculating the behind-target fragment quality after EFP vertical penetration of the target panel on the basis of a Newton second law, an A-T model and an adiabatic shearing theory on the basis ofconsidering the cavity-containing and variable cross-section characteristics of the EFP. According to the method provided by the invention, a reference basis can be provided for evaluating the damageeffect of the terminal sensitive bomb and guiding the design of a protection device.

Description

technical field [0001] The invention relates to the field of distribution of fragments behind a target, in particular to a method for predicting the quality of fragments after an explosively formed projectile (EFP) with a cavity and variable cross-section is penetrating a target plate. Background technique [0002] EFP is a key component of the terminal sensitive projectile warhead to strike the top armor of the ground armor target. After the EFP penetrates the target plate vertically, it will form a fragment cloud on the back of the target plate, causing a devastating blow to the instruments and occupants in the protective device. The fragment cloud behind the target is composed of two parts, which are the fragments produced by the target plate punching body and the fragments produced by the remaining part of the EFP. Analyzing and studying the quality of the target plate and the post-target fragments produced by the EFP is very important for evaluating the damage effect an...

Claims

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Application Information

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IPC IPC(8): G06F17/50F41J5/26
CPCF41J5/26
Inventor 邢柏阳侯云辉郭锐杨永亮江琳刘荣忠
Owner NANJING UNIV OF SCI & TECH
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