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Anti-falling probe loading device
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A loading equipment, anti-dropping technology, applied in the field of mechanical microscope, can solve problems such as probe damage, probe easy to fall off, etc., to achieve the effect of reducing the probability of falling off, good protection, and maintaining stability
Active Publication Date: 2019-11-22
CHONGQING MEDICAL & PHARMA COLLEGE
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Abstract
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Problems solved by technology
[0004] The purpose of the present invention is to provide a fall-off-proof probe loading device to solve the problem in the background art that the probes are easy to fall off during the process of loading them into the probe rack, resulting in damage to the probes
Method used
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Embodiment 1
[0042] Anti-dropping probe loading device, combined with the attached figure 1 , attached figure 2 And attached image 3 As shown, it is mainly composed of tweezers 1, loading body 2, containing body 4, supporting column 6, fixing unit and adjusting unit. The length of the tweezers is 110 mm, the height of the clamping end of the tweezers 1 is 0.4-1.2 mm, one end of the tweezers 1 is rotatably connected to the left part of the top surface of the carrier 2, and the clamping end of the tweezers 1 is used to clamp the rectangular portion of the probe 16.
[0043] The top of the loading body 2 is equipped with a cover (not shown in the figure), which can protect the tweezers 1 and other components during storage. The top surface of the loading body 2 is welded with at least two stop rods 21 (not shown in the figure), and the two stop rods 21 are welded on the top surface of the loading body 2 and are respectively located on both sides of the tweezers 1, and are connected to the...
Embodiment 2
[0058] The difference between this embodiment and Embodiment 1 is that in this embodiment, in combination with the attached Figure 9 As shown, the left and right sides of the fixing base 10 are inclined toward the fixing groove 19, and the side where the first magnet 7 is fixedly installed on the fixing base 10 is also inclined. Correspondingly, both sides of the bottom surface of the limiting block 9 are also inclined toward the protrusion, and the second magnet 8 is fixedly installed on both sides of the limiting block 9 and cooperates with the first magnet 7 .
[0059] Such setting can make the probe 16 fall into the fixed groove 19 more accurately, even if the probe 16 initially slides down to the top surface of the first magnet 7, the probe 16 can also be moved along the inclined first magnet 7. The top surface slides down into the fixing groove 19 , thereby realizing the subsequent fixing of the probe 16 .
Embodiment 3
[0061] The difference between this embodiment and Embodiment 1 is: in this embodiment, in combination with the attached Figure 10 As shown, both sides of the limiting block 9 are provided with inserting strips 22, and the inserting strips 22 are located outside the second magnet 8; both sides of the fixing seat 10 are provided with snap-in grooves that are opposite to and matched with the inserting strips 22, The insertion strip 22 is clamped in the clamping groove.
[0062] Such a design can enhance the stability of the connection between the limiting block 9 and the fixing seat 10 , and further enhance the stability of the probe 16 .
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Abstract
The invention relates to the technical field of mechanical microscopes, and discloses an anti-falling probe loading device, which comprises a loading body. The side portion of the top surface of the loading body is rotatably connected with tweezers; the loading body is provided with a mounting groove, wherein the mounting groove extends along the length direction of the tweezers; the mounting groove is internally provided with an accommodation body; the top portion of the accommodation body is provided with an accommodation groove, wherein the accommodation groove extends along the length direction of the tweezers and is located under the clamping end of the tweezers; the accommodation groove is internally provided with a plurality of fixation units for fixing probes; the bottom portion ofeach fixation unit is connected with one support column; the bottom portion of the accommodation body is provided with an adjusting unit for adjusting the height of each support column; and the adjusting unit is connected with the bottom portions of the support columns. The device can prevent the probes from falling off in the process of moving and installing, and plays a good role in protectingthe probes.
Description
technical field [0001] The invention belongs to the technical field of mechanical microscopy. Background technique [0002] The atomic force microscope is an analytical instrument that can be used to study the surface structure of solid materials including insulators. It studies the surface of substances by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a miniature force sensitive element. structure and properties. Fix one end of a pair of rectangular parts (micro-cantilever) that are extremely sensitive to weak force, and the tiny needle tip at the other end is close to the sample. At this time, it will interact with it, and the force will make the rectangular part (micro-cantilever) deform or move. change. [0003] The nanoscale resolution of the atomic force microscope depends on fine probes, which are precision products and expensive to manufacture. Since different types of tests require the use of different typ...
Claims
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Application Information
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