Reflector reflectivity curve measuring device

A measuring device and reflectivity technology, which is applied in the direction of testing optical performance, etc., can solve problems such as difficult to accurately measure the reflectivity curve of mirrors, and achieve the effect of precise measurement

Inactive Publication Date: 2019-11-26
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, it is difficult to accurately measure the reflectance curve of the mirror with the existing mirror reflectance testing device

Method used

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  • Reflector reflectivity curve measuring device
  • Reflector reflectivity curve measuring device
  • Reflector reflectivity curve measuring device

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Embodiment Construction

[0036] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0037] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0038] Please refer to figure 1 and image 3 , figure 1 A structural diagram of a mirror reflectivity curve measuring device provided for a specific embodiment of the present invention; figure 2 for figure 1 Th...

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Abstract

The invention discloses a reflector reflectivity curve measuring device. The device comprises a beam splitter device, a first PMT detector, a second PMT detector and a rotating support. The beam splitter device divides light into two paths. One path of the light is emitted to the first PMT detector through a first emission hole; the first PMT detector is fixed relative to the first emission hole;and a standard parameter value can be conveniently obtained; the other path of the light is emitted to a to-be-measured reflector through a second emission hole, and enters second PMT detector after being reflected by the to-be-measured reflector; the second PMT detector and the to-be-measured reflector can both rotate relative to the second emission hole; the incident angle of the to-be-measuredreflector can be conveniently adjusted; the second PMT detector can be conveniently used for detecting and receiving light with an incident angle changing continuously; and a measurement parameter value can be obtained. The standard parameter value and the measurement parameter value are compared with each other. Reflectivity curves corresponding to the different incident angles of the to-be-measured reflector are accurately measured. Thus, with the reflector reflectivity curve measurement device provided by the invention adopted, the reflectivity curve of the reflector can be accurately measured.

Description

technical field [0001] The invention relates to the technical field of optical equipment, in particular to a device for measuring reflectivity curves of mirrors. Background technique [0002] With the rapid development of my country's observation field, various cameras and detectors are widely used, and mirrors are used more and more widely in their imaging systems. The reflectivity of mirrors directly affects the imaging quality of the system. For the system, it is very important to measure the reflectivity of the mirror under different imaging bands as a function of the incident angle, in order to perform specific processing on the imaging of the optical system. However, it is difficult to accurately measure the reflectance curve of the mirror with the existing mirror reflectance testing device. [0003] In view of this, it is a technical problem to be solved urgently by those skilled in the art to design a mirror reflectivity curve measuring device to eliminate the defect...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 许洪刚韩冰马洪涛
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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