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Measuring device and method for thermal analysis of samples

A measuring device and thermal analysis technology, applied in the field of thermal analysis, can solve the problem that the measurement is not always satisfactory

Active Publication Date: 2022-06-17
NETZSCH GERATEBAU GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] However, it has been found in practice that even with such an improved embodiment of the measuring device, it is not always satisfactory in certain applications, for example in a series of measurements with high demands on measuring accuracy.

Method used

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  • Measuring device and method for thermal analysis of samples
  • Measuring device and method for thermal analysis of samples
  • Measuring device and method for thermal analysis of samples

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Experimental program
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Embodiment Construction

[0069] figure 1 A schematic side view of the construction of a measuring device known from the prior art for thermal analysis of a sample P is shown. The measuring device has a crucible 10 for supporting the sample P in the crucible 10 and a sensor 20 for measuring the sample temperature of the sample P when the crucible 10 is arranged on the sensor 20 .

[0070] The crucible 10 is constructed of a crucible material typically such as graphite or metal and in the illustrated embodiment has a cylindrical shape comprising a disc-shaped bottom 12 on the edge of which rises upwards adjoining cylindrical sides 14 .

[0071] Terms used herein, such as "upper" or "upper side", "lower" or "lower side", "sideways", etc., respectively refer to the arrangement of the relevant component in the in-use state (when thermal analysis is performed).

[0072] Crucible 10 (optionally) may also have a figure 1 The cover 16 shown in dashed lines in the middle closes the otherwise open interior spa...

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Abstract

The invention relates to a measuring device for thermal analysis of a sample (P) having a crucible (10) for supporting a sample (P) in the crucible (10) and a sensor (20) for a measuring arrangement Sample temperature of the sample (P) in the crucible (10) on the sensor (20). In order to achieve a high degree of reproducibility of the measurements in such a measuring device and the method for thermal analysis carried out by means of it, the measuring device according to the invention has an anti-rotation protection (19, 21) for the crucible (10), In order to set a predetermined rotational position of the crucible (10) relative to the sensor (20) when the crucible (10) is arranged on the sensor (20). Furthermore, the invention proposes a method for thermal analysis of a sample (P) carried out using such a measuring device.

Description

technical field [0001] The invention relates to a measuring device for thermal analysis according to the preamble of claim 1 and a method for thermal analysis according to the preamble of claim 10 . Background technique [0002] Such measuring devices for thermal analysis of samples and methods implemented therewith are disclosed in various embodiments in the prior art. [0003] The relevant methods here have in common that at least one sample arranged in the sample chamber is tempered according to a temperature program, during which the chamber temperature in the interior of the sample chamber changes, wherein during the course of the temperature program by means of a A sensor corresponding to a corresponding sample measures at least one sample temperature of the sample. [0004] The measuring device that is available in this method for arranging a sample and for measuring the temperature of the sample and which is arranged in the sample chamber for this purpose has a cruc...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N25/20
CPCG01N25/20G01N25/4813
Inventor A·辛德勒
Owner NETZSCH GERATEBAU GMBH