Infrared image anomaly monitoring method, apparatus and device based on dual-light fusion
Patent Information
- Authority / Receiving Office
- CN ยท China
- Current Assignee / Owner
- INFIRAY TECH CO LTD
- Publication Date
- 2019-12-31
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Abstract
Description
technical field
[0001] The present application relates to the technical field of image detection, in particular to an abnormality monitoring method, device, equipment and system based on dual-light fusion infrared images. Background technique
[0002] Infrared imaging technology is based on the difference in infrared radiation of objects. Since different objects or different parts of the same object usually have different thermal radiation characteristics, such as temperature difference, emissivity, etc., after thermal infrared imaging, the objects in the infrared image because of It is distinguished by the difference in its heat radiation.
[0003] At present, when the target object in the infrared image is monitored according to the infrared image, it is mainly through monitoring a preset monitoring area (the area with the highest temperature in the infrared image). The thermal imager searches and marks the area with the highest temperature in the current infrared image, ...