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A depth measurement method based on the combination of deep learning and structured light

A technology of deep learning and depth measurement, applied in the field of 3D reconstruction, can solve the problem of low accuracy of depth measurement

Active Publication Date: 2021-07-06
WUHAN UNIV OF SCI & TECH
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Problems solved by technology

[0005] The embodiment of the present application solves the problem of low accuracy of depth measurement in the prior art by providing a depth measurement method based on the combination of deep learning and structured light

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  • A depth measurement method based on the combination of deep learning and structured light
  • A depth measurement method based on the combination of deep learning and structured light
  • A depth measurement method based on the combination of deep learning and structured light

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Embodiment Construction

[0044] In order to better understand the above-mentioned technical solution, the above-mentioned technical solution will be described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0045] This embodiment provides a depth measurement method based on the combination of deep learning and structured light, which uses two branches to process separately, and finally combine with each other to solve the depth value. The structural block diagram is as follows figure 1 shown.

[0046] Specifically, it includes branch one, branch two, and a combined part.

[0047] Branch 1: Calibrate the structured light system to obtain the reference phase, project multiple sinusoidal grating fringe images to the measured object, and collect them with a camera, then calculate the wrapping phase, and compare the wrapping phase with the reference phase to obtain the wrapping deformation phase .

[0048] Branch 2: Use the depth estimation network to ...

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Abstract

The invention belongs to the technical field of three-dimensional reconstruction, and discloses a depth measurement method based on the combination of deep learning and structured light, including: obtaining the package deformation phase through structured light vision; obtaining the initial depth value through deep learning; obtaining the initial depth value according to the initial depth value The first phase compensation coefficient; obtain the real deformation phase according to the package deformation phase and the first phase compensation coefficient, perform phase expansion on the real deformation phase, and obtain the measurement depth value. The invention solves the problem of low precision of depth measurement in the prior art, and can effectively improve the measurement precision.

Description

technical field [0001] The invention relates to the technical field of three-dimensional reconstruction, in particular to a depth measurement method based on the combination of deep learning and structured light. Background technique [0002] The traditional two-dimensional imaging technology can no longer meet the needs of people today. Since the image is the projection of the three-dimensional space in the optical system, it is not enough to realize the recognition of the image level. The higher level of computer vision must be to accurately obtain the objects in the three-dimensional space. Through 3D reconstruction technology, the detection, recognition, tracking and interaction of objects in 3D space can be realized. Now, more and more technologies based on 3D images are emerging. In order to obtain real 3D images, it is usually necessary to perform depth perception on scenes or objects. [0003] Among a series of technologies for collecting three-dimensional informati...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01C11/30G06N3/04
CPCG01C11/30G06N3/045
Inventor 常婉向森邓慧萍吴谨
Owner WUHAN UNIV OF SCI & TECH