Multi-stress accelerated test profile determination method, system, medium and equipment
An accelerated test and multi-stress technology, applied in the field of accelerated test load magnitude and period determination under multi-stress conditions, multi-stress accelerated test profile determination, can solve problems such as not being well applicable, and reduce the multi-stress accelerated test profile , shorten the test cycle, reduce the effect of a large amount of consumption
Active Publication Date: 2021-05-25
SHANGHAI SPACE PRECISION MACHINERY RES INST
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This patent is not well applicable to the determination of multi-stress accelerated test profiles
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[0038] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0039] Such as figure 1 As shown, a method for determining a multi-stress accelerated test profile according to the present invention includes: Step 1: Determine the test stress type and obtain the test stress type information; the analysis of the electromechanical test object needs to include temperature stress, humidity stress and electrical stress. Stress; Step 2: According to the test stress type information, establish a temperature-humidity multi-stress acceleration model, which is characterized by...
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The invention provides a method, system, medium and equipment for determining the profile of a multi-stress accelerated test, including: step 1: determine the type of test stress; step 2: establish a temperature-humidity electric multi-stress acceleration model according to the type information of the test stress; step 3 : Establish the finite element analysis model of the test object; Step 4: Determine the initial acceleration test profile, select the initial acceleration test load magnitude parameters, initial acceleration test load cycle parameters; Step 5: Create a comprehensive acceleration factor model of temperature, humidity and electrical stress; Step 6: Calculate the fatigue life of the test object, and then divide the fatigue life by one cycle to get the number of failure cycles; Step 7: Calculate the number of failure cycles of the test object under different stress levels; Step 8: Calculate the acceleration ratio of the test object; Step 9: Judging whether the acceleration ratio of the test object meets the predetermined test requirements; Step 10: Obtaining guidance information for multi-stress accelerated tests; the present invention can reduce the consumption of a large number of test samples.
Description
technical field [0001] The present invention relates to the field of methods for determining test profiles, in particular to a method, system, medium and equipment for determining a multi-stress accelerated test profile, and in particular to a method for determining the load magnitude and period of an accelerated test under multi-stress conditions. Background technique [0002] Since the accelerated life test of electromechanical equipment helps to establish the quality of product and process design, it leads to better product design and production process, further improves the mean time between failures, and greatly saves costs. Traditional accelerated life test methods are often aimed at a single stress condition. However, from the failure mode analysis of electromechanical products or test pieces, it can be found that the combined effect of temperature stress, humidity stress and electrical stress is the main factor leading to its destructive failure. Therefore, electrom...
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IPC IPC(8): G01M99/00
CPCG01M99/005
Inventor 刘博蒋刚王肇喜周星光柳世灵汤杰梁山翟师慧
Owner SHANGHAI SPACE PRECISION MACHINERY RES INST