Test fixture convenient facilitating rapid accessory switching

A technology for fast switching and testing fixtures, which is applied in the direction of measuring devices, measuring electrical variables, measuring device shells, etc., which can solve problems such as insufficient bonding of chips, and achieve the effect of preventing insufficient bonding

Inactive Publication Date: 2020-03-27
JIANGSU DEPER GATING TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Aiming at the deficiencies of the prior art, the present invention provides a test fixture th...

Method used

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  • Test fixture convenient facilitating rapid accessory switching
  • Test fixture convenient facilitating rapid accessory switching
  • Test fixture convenient facilitating rapid accessory switching

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Embodiment Construction

[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0022] see Figure 1-3 , in this embodiment: a test fixture that is convenient for quick switching of accessories, including a main body 1, a first fixed block 2 is fixedly connected to the top surface of the main body 1, and a groove is opened on the top surface of the first fixed block 2. A first rotating shaft 3 is rotatably connected to the inner wall of the groove of a fixed block 2, a cover plate 4 is fixedly connected to the surface of the first rotatin...

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Abstract

The invention belongs to the technical field of electronic equipment. The invention relates to a test fixture, in particular to a test fixture facilitating rapid accessory switching. The test fixtureincludes a body, a first fixed block is fixedly connected to the top end surface of the main body; a groove is formed in the surface of the top end of the first fixing block; a first rotating shaft isrotatably connected to the inner wall of the groove of the first fixing block, a cover plate is fixedly connected to the surface of the first rotating shaft, a connecting block is fixedly connected to the surface of the end, away from the first rotating shaft, of the cover plate, an inserting rod is fixedly connected to the bottom end of the connecting block, a cavity is formed in the body, and an inner connecting rod is fixedly connected to the inner wall of the cavity. According to the test fixture, the test groove is formed, the clamping plate is pressed to be attached to the test chip under the action of the elastic force of the second spring, the cover plate is rotated to be attached to the main body, and then the insertion rod is inserted into the fixing ring to achieve a locking effect, so that the influence on a test result due to untight attachment is prevented.

Description

technical field [0001] The invention relates to the technical field of electronic equipment, in particular to a test fixture for quick switching of accessories. Background technique [0002] Test fixtures are widely used in test workshops to detect newly produced electronic components or repaired electronic components to judge the performance of the electronic components, especially when it comes to gated infrared sensors, which use infrared rays to perform A sensor for data processing has the advantages of high sensitivity. The infrared sensor can control the operation of the drive device and use the physical properties of infrared rays to measure the sensor. Infrared ray, also known as infrared light, has properties such as reflection, refraction, scattering, interference, and absorption. Any substance, as long as it has a certain temperature (above absolute zero), can radiate infrared rays. The infrared sensor is not in direct contact with the measured object during mea...

Claims

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Application Information

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IPC IPC(8): G01R1/04
CPCG01R1/0408
Inventor 徐冀
Owner JIANGSU DEPER GATING TECH CO LTD
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