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A test device, system and method for a satellite receiver

A satellite receiver and test device technology, which is applied in the transmission system, receiver monitoring, radio transmission system, etc., can solve the problem of low test efficiency of satellite receivers, and achieve the effect of improving test efficiency

Active Publication Date: 2021-02-19
TECHTOTOP MICROELECTRONICS
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of this, the embodiment of the present application provides a satellite receiver testing device, system and method to solve the problem of low test efficiency in the current performance testing process of satellite receivers

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  • A test device, system and method for a satellite receiver
  • A test device, system and method for a satellite receiver
  • A test device, system and method for a satellite receiver

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Embodiment Construction

[0039] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0040] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other Presence or addition of features, wholes, steps, operations, elements, components and / or collections thereof.

[0041] It should...

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Abstract

This application is applicable to the technical field of testing, and provides a satellite receiver testing device, system and method, including a satellite signal receiving module, a signal switching module, a signal simulation module, and a signal attenuation module. The satellite signal receiving module is used to receive real satellites signal; the signal simulation module is used to generate simulated satellite signals according to the generation control instructions of the host computer; the signal switching module is used to switch between real satellite signals and simulated satellite signals according to the switching control instructions of the host computer; the signal attenuation module is used to adjust the signal according to the host computer The control command adjusts the power of the signal input by the signal switching module, receives the real satellite signal through the built-in satellite signal receiving module, generates the simulated satellite signal through the signal simulation module, and switches the real satellite signal and the simulated satellite signal according to the control command of the host computer , and then realize the automatic switching between the analog signal test environment and the real signal test environment, and improve the test efficiency.

Description

technical field [0001] The present application belongs to the technical field of testing, and in particular relates to a testing device, system and method for a satellite receiver. Background technique [0002] Satellite receiver manufacturers need to perform performance tests on satellite receivers when designing and evaluating receiver performance. When performing performance testing, satellite analog signal sources are usually used to test receiver sensitivity, test the performance of satellite receivers in real environments, and the accuracy of differential positioning functions. These tests usually need to set up a test environment to test the satellite receiver, respectively, to build a simulated signal environment and a real signal environment, and to build a test environment separately requires manpower, and when the environment is rebuilt, the test will be interrupted, so it cannot be fully automated. Test, test efficiency is affected. [0003] To sum up, there is...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/00H04B17/29H04B7/185
CPCH04B7/18519H04B17/0087H04B17/29
Inventor 张志林高峰许祥滨
Owner TECHTOTOP MICROELECTRONICS
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