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Method and device for determining jitter time, storage medium and electronic equipment

A technology of jitter time and determination method, applied in the direction of measuring device, electronic circuit testing, measuring electricity, etc., can solve problems such as complex process and achieve the effect of reducing labor cost

Active Publication Date: 2022-01-11
CHANGXIN MEMORY TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present disclosure is to provide a method and device for determining the jitter time, a storage medium and electronic equipment, and then at least to a certain extent overcome the problem in the prior art that the oscilloscope is used to measure the jitter time and the process is complicated

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  • Method and device for determining jitter time, storage medium and electronic equipment
  • Method and device for determining jitter time, storage medium and electronic equipment
  • Method and device for determining jitter time, storage medium and electronic equipment

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Embodiment Construction

[0063] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals denote the same or similar parts in the drawings, and thus their repeated descriptions will be omitted.

[0064] Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced without one or mo...

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Abstract

The present disclosure relates to a method and device, a storage medium, and an electronic device for determining the jitter time. The method for determining the jitter time includes determining multiple detection time points of an output signal of an integrated circuit; The signals are respectively compared with preset signals to determine whether each detection time point is a jitter point; and the jitter time of the output signal of the integrated circuit is determined according to the jitter point. The present disclosure can determine the jitter time of the output signal of the integrated circuit chip without additional equipment.

Description

technical field [0001] The present disclosure relates to the technical field of integrated circuit testing, and in particular, to a method and device for determining jitter time, a storage medium, and electronic equipment. Background technique [0002] With the development of electronics and communication technology, jitter is not only an important consideration in analog design, but also in the field of data design, which has been paid more and more attention. Jitter can be understood as a measurement of the time-domain variation of a signal, which describes the degree to which a signal cycle deviates from its ideal value. [0003] Currently, an oscilloscope is usually used to measure the waveform of the signal to determine the jitter time. However, on the one hand, this measurement method requires an oscilloscope on the test machine or an external oscilloscope; on the other hand, the oscilloscope measures a single waveform, that is to say, it is generally difficult for th...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2882G01R31/31709G01R31/2856G01R31/31713G01R31/31718G01R31/31726
Inventor 陆天辰李垣杰
Owner CHANGXIN MEMORY TECH INC