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Method for measuring surface emissivity of object, device, equipment and storage medium

A technology of object surface and measurement method, which is applied in the field of equipment, computer-readable storage media, devices, and object surface emissivity measurement method, can solve the problems that errors cannot be eliminated, sample emissivity is difficult to measure, and test conditions are harsh, etc., to achieve The effect of improving accuracy, low test condition requirements, and eliminating error interference

Pending Publication Date: 2020-08-25
IRAY TECH CO LTD
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the currently used reflectance method often needs to use a standard sample reference, the test conditions are harsh, and the error caused by the reflection of the measured sample to the surrounding environment radiation cannot be eliminated, and it is difficult for the sample with a low emissivity Measurement

Method used

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  • Method for measuring surface emissivity of object, device, equipment and storage medium
  • Method for measuring surface emissivity of object, device, equipment and storage medium
  • Method for measuring surface emissivity of object, device, equipment and storage medium

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Embodiment Construction

[0036] The core of the present invention is to provide a technical solution for measuring the emissivity of the surface of a material object, so that the measurement result can eliminate the interference error caused by the external environment to the greatest extent, and at the same time simplify the operation process of measuring the emissivity and reduce the requirements for the test environment .

[0037] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0038]...

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Abstract

The invention discloses a method for measuring the surface emissivity of an object. The method comprises the steps that the surface of a to-be-measured object is irradiated by an infrared light sourceand is not irradiated by the infrared light source; wherein the infrared sensor senses a first infrared sensing signal and a second infrared sensing signal output by infrared light radiated by an object to be measured, and the infrared light source radiates a third infrared sensing signal generated by the infrared sensor to determine the reflectivity of the surface of the object to be measured toinfrared light output by the infrared light source; and determining the emissivity of the to-be-measured object according to the reflectivity. When the emissivity of the to-be-measured object is measured, a standard sample does not need to be used as a reference, error interference of the external environment on the test result can be well eliminated, the requirement for the test condition is low, the test process is simplified, and the accuracy of the test result is improved. The invention further provides an object surface emissivity measuring device and equipment and a computer readable storage medium, which have the above beneficial effects.

Description

technical field [0001] The present invention relates to the technical field of material emissivity, in particular to a method, device, equipment and computer-readable storage medium for measuring the surface emissivity of an object. Background technique [0002] Emissivity is defined as the ratio of the surface radiant energy of a material to the radiant energy of a black body at the same temperature. The surface emissivity of various materials is an important thermophysical parameter of materials. The measurement of material emissivity involves the application of materials in aerospace, military, chemical, construction, medical, new energy and other fields. [0003] In the prior art, there are mainly three methods for measuring emissivity of materials: calorimetry, reflectivity method, and radiation energy method. However, the currently used reflectance method often needs to use a standard sample reference, the test conditions are harsh, and the error caused by the reflec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01N21/552G01N21/3563
CPCG01N21/01G01N21/552G01N21/3563
Inventor 王祥辉齐亚鲁
Owner IRAY TECH CO LTD
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