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Cross wire pattern unit, reticle and method for measuring amplification factor of back projection light path

A technology of optical path amplification and crosshair, which is applied in the field of optical detection, can solve the problems of measuring MTF error and inability to measure the magnification of conjugate optical path, etc., and achieve the effect of improving measurement accuracy

Active Publication Date: 2020-11-24
FUZHOU ICAMSYS PHOTOELECTRIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Compared to the other two patterns, such as image 3 The reticle pattern shown has the advantage of being simpler in content and is more versatile, but also has the disadvantage of not being able to measure the magnification of the conjugate optical path
The magnification of the conjugate optical path is the key parameter for converting the result calculated by the algorithm into the MTF characteristic of the image. When it cannot be measured in the cross-hair screen, the online measurement MTF can only calculate the MTF according to the fixed magnification input in advance. The default The magnification of the tested lenses of the same batch is the same, but there are differences in reality, so there is an error in the measurement of MTF

Method used

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  • Cross wire pattern unit, reticle and method for measuring amplification factor of back projection light path
  • Cross wire pattern unit, reticle and method for measuring amplification factor of back projection light path
  • Cross wire pattern unit, reticle and method for measuring amplification factor of back projection light path

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Embodiment 1

[0041] Such as Figure 6 As shown, a reticle pattern unit that can measure the magnification of the back projection optical path includes a reticle pattern 1 arranged in the middle of the reticle pattern unit, and is characterized in that: in four quadrants divided by the reticle pattern 1 There is one positioning point 2 , and the connecting lines of the positioning points 2 in two adjacent quadrants are all parallel to one of the lines of the crosshair pattern 1 .

Embodiment 2

[0043] A reticle with the reticle pattern unit described in the first embodiment is characterized in that: the reticle 3 is provided with one reticle pattern unit as described in the first embodiment.

Embodiment 3

[0045] Such as Figure 6-7 As shown, a method for measuring the magnification of the back projection optical path by using the reticle pattern unit described in Embodiment 1 is characterized in that it includes the following steps:

[0046]① On the image side of the lens under test 4, along the optical axis of the lens under test 4 and relative to the lens under test 4, a light source device 5 and a reticle 3 are arranged in sequence from far to near, and the reticle 3 is provided with The reticle pattern unit described in one of the above embodiments; and the image sensor 6 for collecting the image information formed by the reticle pattern unit on the reticle 3 is arranged on the object side side of the measured lens 4;

[0047] ② Measuring the distances l1, l2, l3, l4 between the positioning points 2 in every two adjacent quadrants in the crosshair pattern unit respectively;

[0048] ③ Calculate respectively the distances L1, L2, L3 and L4 between the centers of the diffuse...

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Abstract

The invention relates to a cross wire pattern unit, a reticle, a method for measuring the amplification factor of a back projection light path and a method for establishing an MTF curve two-dimensional coordinate graph of a measured lens by adopting the cross wire pattern unit. The cross wire pattern unit comprises a cross wire pattern arranged in the middle of a cross wire pattern unit, a positioning point is arranged in each of four quadrants divided by the cross wire pattern, and the connecting line of the positioning points in every two adjacent quadrants is parallel to one line of the cross wire pattern. Due to the fact that the positioning points are arranged in the cross wire pattern unit, the amplification factor of a measured conjugate light path can be conveniently determined bymeasuring the distance between the positioning points; according to the method for measuring the amplification factor, the problem of errors caused by the fact that the amplification factors of the to-be-measured lenses of the same batch are the same by default in on-line measurement of the MTF can be solved so that the result calculation of the MTF can use the real amplification factor instead ofthe amplification factor values preset in batches, and the measurement precision is improved.

Description

technical field [0001] The invention relates to the field of optical detection, in particular to a crosshair pattern unit, a reticle, a method for measuring the magnification of a back projection optical path, and a method for establishing a two-dimensional coordinate diagram of an MTF curve of a lens under test by using the crosshair pattern unit. Background technique [0002] Using the optical path of back projection, place a reticle engraved with a specific pattern and a backlight on the image plane of the lens under test, place multiple image sensors on the object plane, and obtain the multiples of the lens under test through focus adjustment and image calculation. Point MTF data is currently the main way to measure lens MTF online. The MTF characteristics of the optical system can be obtained by software analysis of the images obtained by the image sensor. The optical path of the back projection measurement MTF includes such as figure 1 The infinite distance conjugate...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 孙宏
Owner FUZHOU ICAMSYS PHOTOELECTRIC TECH
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