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Reflecting surface and compact range measuring system with reflecting surface

A reflective surface and working surface technology, which is applied in the direction of measuring devices, measuring electrical variables, antenna radiation patterns, etc., can solve the problems of adverse effects and limited size of the quiet zone, and achieve the effect of improving the performance of the quiet zone and reducing edge scattering

Pending Publication Date: 2020-11-27
GENERAL TEST SYST
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Problems solved by technology

Since the size of the reflecting surface in the anechoic chamber is limited, its edge will scatter the incident spherical wave, and the resulting scattering will have a bad influence on the quiet zone

Method used

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  • Reflecting surface and compact range measuring system with reflecting surface
  • Reflecting surface and compact range measuring system with reflecting surface
  • Reflecting surface and compact range measuring system with reflecting surface

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Embodiment Construction

[0020] Embodiments of the present disclosure are described in detail below, examples of which are illustrated in the drawings, in which the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present disclosure and should not be construed as limiting the present disclosure.

[0021] The compact field measurement system uses a designed reflector to transform the spherical wave generated by the feed antenna into a plane wave or quasi-plane wave in a short distance, so as to meet the far-field measurement requirements. According to the principle of reciprocity of sending and receiving, in some application scenarios, the reflective surface can also be used to receive the signal emitted by the DUT, for example, to focus and receive the energy radiated by the DUT in a direction parallel to the focal a...

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Abstract

The invention provides a reflecting surface and a compact range measuring system with the reflecting surface. The reflecting surface comprises a working surface which is used for reflecting sphericalelectromagnetic waves emitted by the feed source antenna and converting the spherical electromagnetic waves into planar electromagnetic waves; a wave absorbing structure which is made of an electromagnetic wave absorbing material, wherein the wave absorbing structure is arranged on the edge of the working surface and is used for reducing edge scattering of the working surface. The reflecting surface provided by the embodiment of the invention can be used for a compact range measurement system. According to the reflecting surface disclosed in the embodiment of the invention, edge scattering canbe reduced, and the dead zone performance of the compact range measurement system is improved.

Description

technical field [0001] The disclosure relates to the field of compact field measurement, in particular to a reflective surface and a compact field measurement system with the reflective surface. Background technique [0002] The compact field measurement system can provide a quasi-plane wave measurement area with excellent performance in a short distance. The compact field measurement system uses a precise reflector to convert the spherical wave emitted by the feed antenna into a plane wave within a short distance, so as to meet the far-field measurement requirements. The compact field measurement system is capable of simulating the far-field plane wave electromagnetic environment in a small anechoic chamber for multiple measurements and researches. For example, the electromagnetic characteristics such as the main lobe, side lobe, and back lobe distribution of the antenna pattern to be tested can be obtained, and then Obtain active or passive performance of antennas or term...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01Q15/14H01Q17/00G01R29/10
CPCG01R29/105H01Q15/14H01Q17/00
Inventor 漆一宏刘列吴济宇张颖蔡张华张辉彬
Owner GENERAL TEST SYST
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