Unlock instant, AI-driven research and patent intelligence for your innovation.

Reverse adjustment method for P-type polycrystalline silicon resistor and p-type diffusion region resistor in CMOS process

A polysilicon resistance and reverse adjustment technology, which is applied in the manufacture of circuits, electrical components, semiconductors/solid-state devices, etc., can solve the problems of inability to realize the reverse adjustment of the resistance value, and achieve the effect of realizing the resistance value

Pending Publication Date: 2020-12-04
SHANGHAI HUALI INTEGRATED CIRCUTE MFG CO LTD
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the above-mentioned shortcoming of prior art, the object of the present invention is to provide a kind of P-type polysilicon resistance and p-type diffused area resistance reverse adjustment method in CMOS technology, be used to solve the problem of P-type polysilicon resistance in CMOS technology in the prior art. The problem that the resistance of the p-type diffusion region increases or decreases at the same time and the reverse adjustment of the resistance of the two resistances cannot be realized

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Reverse adjustment method for P-type polycrystalline silicon resistor and p-type diffusion region resistor in CMOS process
  • Reverse adjustment method for P-type polycrystalline silicon resistor and p-type diffusion region resistor in CMOS process
  • Reverse adjustment method for P-type polycrystalline silicon resistor and p-type diffusion region resistor in CMOS process

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0026] see Figure 1 to Figure 5 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arb...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a reverse adjustment method for a P-type polysilicon resistor and a p-type diffusion region resistor in a CMOS process. The reverse adjustment method comprises the following steps of forming a diffusion region of the P-type diffusion region resistor; forming a polycrystalline silicon structure of the P-type polycrystalline silicon resistor; injecting fluorine ions with the energy of 8keV into the diffusion region and the polycrystalline silicon structure in the ion implantation process of the source and drain regions of the CMOS process; covering a layer of SAB structureon the polycrystalline silicon structure, and exposing two ends of the polycrystalline silicon structure; covering a layer of SAB structure on the diffusion region, and exposing two ends of the diffusion region; and forming contact holes in the exposed parts at the two ends of the polycrystalline silicon structure and in the exposed parts at the two ends of the diffusion region respectively. According to the invention, the energy of fluorine ion combined injection is adjusted in the forming process of the source and drain regions of an MOSFET device, and the grain size in the P-type polycrystalline silicon and the concentration distribution of boron ions in the diffusion region are changed at the same time, so that the reverse adjustment of the resistance values of the P-type polycrystalline silicon resistor and the P-type diffusion region resistor is realized.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a reverse adjustment method for p-type polysilicon resistance and p-type diffusion region resistance in a CMOS process. Background technique [0002] Resistors are an important part of digital and analog CMOS integrated circuits, and their main functions are current limiting and voltage dividing. Resistors can be divided into active resistors and passive resistors. Active resistors usually use the resistance characteristics of transistors in a specific working area, while passive resistors are usually formed by doping, such as polysilicon resistors, diffused region resistors Wait. Because passive resistors are not affected by current and voltage and have stable performance, passive resistors are used in most integrated circuit designs. [0003] The resistance value of the passive resistor is mainly determined by the doping and heat treatment process. In the standard CMO...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/8238
CPCH01L21/8238H01L21/823814
Inventor 石晶朱巧智
Owner SHANGHAI HUALI INTEGRATED CIRCUTE MFG CO LTD