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Measurement method of polarization-dependent attenuation of optical devices

A technology of polarization correlation and measurement method, which is applied in the direction of testing optical performance, etc., can solve the problems of low measurement accuracy and inability to accurately characterize the characteristics of passive optical devices, and achieve the effect of improving accuracy

Active Publication Date: 2022-02-11
上海中科创欣通讯设备有限公司 +2
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Problems solved by technology

However, the traditional method of the four-state method does not meet the requirement of maximizing the difference of the input polarization state, so the measurement accuracy is low, and the characteristics of the passive optical device cannot be accurately characterized.

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  • Measurement method of polarization-dependent attenuation of optical devices
  • Measurement method of polarization-dependent attenuation of optical devices
  • Measurement method of polarization-dependent attenuation of optical devices

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Embodiment Construction

[0031] The method for measuring the polarization-dependent attenuation of the optical device of the present invention comprises the following steps:

[0032] Step 1. The polarization state of the input light to the polarization controller is random and arbitrary. The polarization controller consists of three fiber rings, which are equivalent to the first λ / 4 wave plate, λ / 2 wave plate, and the second λ / 4 wave plates, these three wave plates rotate independently along the same rotation axis, and can output any desired polarization state;

[0033] Step 2. Set the polarizer between the output end of the polarization controller and the optical power meter, and rotate the three wave plates of the polarization controller in turn until the optical power meter receives the maximum power. At this time, determine the output t1 state of the polarization controller , the rotation angles of the three wave plates are α, β, γ respectively, and the direction sequence of the polarization cont...

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Abstract

The invention discloses a method for measuring the polarization-related attenuation of an optical device. In the method, a polarizer is arranged between the output end of a polarization controller and an optical power meter, and three wave plates of the polarization controller are rotated in turn until the optical power meter When the maximum power is received, determine the output t1 state of the polarization controller at this time, and the direction sequence of the polarization controller is A(α, β, γ); remove the analyzer, and set the optical device to be tested at the output end of the polarization controller and the optical Between the power meters, record the optical power I1 corresponding to the t1 state; by rotating the wave plate, sequentially convert the polarization controller direction sequence to B, C, and D, and record the corresponding optical power, the maximum value of the four optical power values The difference from the minimum value is the polarization-dependent attenuation value of the optical device under test. This method overcomes the defects of the traditional four-state method for polarization-dependent attenuation measurement, and maximizes the angular separation of the four input polarization states on the Poincar sphere, thereby improving the accuracy of polarization-dependent attenuation measurement and accurately characterizing the characteristics of passive optical devices.

Description

technical field [0001] The invention relates to the technical field of optical device manufacturing, in particular to a method for measuring the polarization-dependent attenuation of an optical device. Background technique [0002] Polarization-dependent attenuation (PDL) is the maximum transmission difference of an optical device in all polarization states, that is, the ratio of the maximum transmission to the minimum transmission of an optical device in all polarization states, and is a standard index to describe the characteristics of passive optical devices. The PDL measurement of an optical device must pass the maximum and minimum optical power of the device, and one of the key difficulties is that the polarization direction corresponding to the maximum and minimum power is unknown. [0003] One measurement method is the full-state method, which provides all possible polarization states for the input light of the device under test, and measures the optical power at the ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 洪亮张笃峰
Owner 上海中科创欣通讯设备有限公司