Method for measuring polarization dependent attenuation of optical device
A polarization correlation and measurement method technology, applied in the direction of testing optical performance, can solve the problems of low measurement accuracy, inability to accurately characterize the characteristics of passive optical devices, etc., to achieve the effect of improving accuracy
Active Publication Date: 2020-12-29
上海中科创欣通讯设备有限公司 +2
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However, the traditional method of the four-state method does not meet the requirement of maximizing the difference of the input polarization state, so the measurement accuracy is low, and the characteristics of the passive optical device cannot be accurately characterized.
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[0031] The method for measuring the polarization-dependent attenuation of the optical device of the present invention comprises the following steps:
[0032] Step 1. The polarization state of the input light to the polarization controller is random and arbitrary. The polarization controller consists of three fiber rings, which are equivalent to the first λ / 4 wave plate, λ / 2 wave plate, and the second λ / 4 wave plates, these three wave plates rotate independently along the same rotation axis, and can output any desired polarization state;
[0033] Step 2. Set the polarizer between the output end of the polarization controller and the optical power meter, and rotate the three wave plates of the polarization controller in turn until the optical power meter receives the maximum power. At this time, determine the output t1 state of the polarization controller , the rotation angles of the three wave plates are α, β, γ respectively, and the direction sequence of the polarization cont...
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The invention discloses a method for measuring polarization dependent attenuation of an optical device. The method comprises the following steps of: arranging an analyzer between the output end of a polarization controller and an optical power meter, sequentially rotating three wave plates of the polarization controller until the optical power meter receives the maximum power, and determining theoutput t1 state of the polarization controller, wherein the direction sequence of the polarization controller is A (alpha, beta, gamma); removing the analyzer, arranging the optical device to be measured between the output end of the polarization controller and the optical power meter, and recording the optical power I1 corresponding to the t1 state; and sequentially converting the direction sequence of the polarization controller by rotating the wave plates, and recording the corresponding optical power, wherein the difference between the maximum value and the minimum value in the four optical power values is the polarization dependent attenuation value of the optical device to be measured. The method overcomes the defects of the traditional four-state method for measuring the polarization dependent attenuation, and maximizes the separation of the four input polarization states on the angle of a poincare spherical surface, thereby improving the precision of the polarization dependentattenuation measurement and accurately characterizing the characteristics of a passive optical device.
Description
technical field [0001] The invention relates to the technical field of optical device manufacturing, in particular to a method for measuring the polarization-dependent attenuation of an optical device. Background technique [0002] Polarization-dependent attenuation (PDL) is the maximum transmission difference of an optical device in all polarization states, that is, the ratio of the maximum transmission to the minimum transmission of an optical device in all polarization states, and is a standard index to describe the characteristics of passive optical devices. The PDL measurement of an optical device must pass the maximum and minimum optical power of the device, and one of the key difficulties is that the polarization direction corresponding to the maximum and minimum power is unknown. [0003] One measurement method is the full-state method, which provides all possible polarization states for the input light of the device under test, and measures the optical power at the ...
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IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 洪亮张笃峰
Owner 上海中科创欣通讯设备有限公司