A semiconductor device defective inspection system
A detection system and semiconductor technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as not being screened out in time and affecting product quality, and achieve the effect of preventing market entry and accurate capture
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[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0035] see Figure 1-6 , the present invention provides a technical solution: a semiconductor device defect detection system, including a frame 1, a frame 2 installed on the frame 1, a drive roller shaft 3 rotatably connected to the frame 2, and a The two sets of conveyor belts 4 on the drive roller shaft 3 and the detection mechanism 6 installed on the frame 1, the upper end of the frame 2 is equipped with a cylinder 14, the inner end of the frame 2 is fixedly con...
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