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Interference imaging spectrometer detector block effect correction method

A technology of interference imaging and correction method, which is applied in the direction of interference spectroscopy, spectrometry/spectrophotometry/monochromator, instrument, etc., and can solve the problem of image inhomogeneity correction and inconsistent detector response that cannot be applied to interference imaging spectrometer , Ignoring the dynamic changes of the detector block effect and other issues, to achieve the effect of removing adverse effects, improving stability and accuracy, and reducing impact

Active Publication Date: 2021-03-12
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The present invention solves the technical problem that the correction method of the existing detector response inconsistency cannot be applied to image non-uniformity correction of large field of view and high-resolution interference imaging spectrometer due to ignoring the dynamic change of detector block effect, and provides an interferometric Correction Method for Imaging Spectrometer Detector Blocking Effect

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  • Interference imaging spectrometer detector block effect correction method
  • Interference imaging spectrometer detector block effect correction method
  • Interference imaging spectrometer detector block effect correction method

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Embodiment Construction

[0049] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention and the accompanying drawings. Apparently, the described embodiments do not limit the present invention.

[0050]The sampling of the interference imaging spectrometer varies with temperature (time), resulting in block effects in the block output image, which makes the image uniformity poor. Such as figure 2 It is a quick view of the integrating sphere data collected by the interferometric imaging spectrometer in 1 second. After dark current removal, bad pixel correction and detector response correction, it can be seen that the image still has obvious block effect, and its spatial dimension difference curve (using the interferometric Dimensional average representation) such as image 3 As shown, the downward concave portion of the curve represents the edge of the block.

[0051] In the method for correcting the bl...

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Abstract

The invention relates to a block effect correction method, and aims to solve the technical problem that an existing correction method for inconsistent detector response cannot be suitable for non-uniformity correction of an image of a large-field-of-view high-resolution interference imaging spectrometer due to neglect of dynamic change of a detector block effect. The invention provides an interference imaging spectrometer detector block effect correction method which comprises the following steps: continuously acquiring light source data under different brightness levels of an integrating sphere through an interference imaging spectrometer, segmenting the acquired data according to a time sequence and a preset time interval, and calculating an average value image; and averaging according to interference dimensions to obtain a spatial dimension block effect curve, performing polynomial fitting to obtain an eliminated block effect smooth curve, solving a block effect correction coefficient through a ratio method, and dividing the data acquired by the interference imaging spectrometer by the block effect correction coefficient at the corresponding time to obtain an eliminated block effect interference pattern.

Description

technical field [0001] The invention relates to a detector block effect correction method, in particular to a detector block effect correction method for an interference imaging spectrometer. Background technique [0002] For large-field-of-view and high-resolution interferometric imaging spectrometers, it is generally necessary to configure a large detector area array due to the requirements for a wide range and high resolution of the acquired images. In the actual manufacturing process of the instrument, the large detector area array is usually spliced ​​by multiple detectors, the CCD drive signal is sent to the CCD after passing through the driver, and the horizontal drive signal of the spectrometer CCD (charge-coupled device) and the AD sampling clock. The phase relationship will change with the temperature, and the delay of the driver to the signal will drift in ns level with the operating temperature of the device, causing the sampling position to drift with the imagin...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28G01J3/45G01J3/02
CPCG01J3/0275G01J3/0297G01J3/2823G01J3/45G01J2003/452
Inventor 陈铁桥李思远李海巍王爽刘学斌张耿冯向朋陈小来刘强刘佳刘杰王一豪
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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