Interference imaging spectrometer detector block effect correction method

Abstract

The invention relates to a block effect correction method, and aims to solve the technical problem that an existing correction method for inconsistent detector response cannot be suitable for non-uniformity correction of an image of a large-field-of-view high-resolution interference imaging spectrometer due to neglect of dynamic change of a detector block effect. The invention provides an interference imaging spectrometer detector block effect correction method which comprises the following steps: continuously acquiring light source data under different brightness levels of an integrating sphere through an interference imaging spectrometer, segmenting the acquired data according to a time sequence and a preset time interval, and calculating an average value image; and averaging according to interference dimensions to obtain a spatial dimension block effect curve, performing polynomial fitting to obtain an eliminated block effect smooth curve, solving a block effect correction coefficient through a ratio method, and dividing the data acquired by the interference imaging spectrometer by the block effect correction coefficient at the corresponding time to obtain an eliminated block effect interference pattern.

Description

technical field [0001] The invention relates to a detector block effect correction method, in particular to a detector block effect correction method for an interference imaging spectrometer. Background technique [0002] For large-field-of-view and high-resolution interferometric imaging spectrometers, it is generally necessary to configure a large detector area array due to the requirements for a wide range and high resolution of the acquired images. In the actual manufacturing process of the instrument, the large detector area array is usually spliced ​​by multiple detectors, the CCD drive signal is sent to the CCD after passing through the driver, and the horizontal drive signal of the spectrometer CCD (charge-coupled device) and the AD sampling clock. The phase relationship will change with the temperature, and the delay of the driver to the signal will drift in ns level with the operating temperature of the device, causing the sampling position to drift with the imagin...

AI Technical Summary

Problems solved by technology

[0004] The present invention solves the technical problem that the correction method of the existing detector response inconsistency cannot be applied to image non-uniformity correction of large field of view and high-resolution interference imaging spectrometer due to ignoring the dynamic change of detector block effect, and provides an interferometric Correction Method for Imaging Spectrometer Detector Blocking Effect

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