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A correction method for detector block effect of interferometric imaging spectrometer

A technology of interferometric imaging and correction method, applied in interferometric spectroscopy, spectrometry/spectrophotometry/monochromator, instruments, etc., which can solve the problem of non-uniformity correction of interferometric imaging spectrometer images and inconsistent detector response. , ignoring the dynamic changes of the detector block effect, etc., to achieve the effect of removing adverse effects, improving stability and accuracy, and good stability and accuracy

Active Publication Date: 2021-10-15
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The present invention solves the technical problem that the correction method of the existing detector response inconsistency cannot be applied to image non-uniformity correction of large field of view and high-resolution interference imaging spectrometer due to ignoring the dynamic change of detector block effect, and provides an interferometric Correction Method for Imaging Spectrometer Detector Blocking Effect

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  • A correction method for detector block effect of interferometric imaging spectrometer
  • A correction method for detector block effect of interferometric imaging spectrometer
  • A correction method for detector block effect of interferometric imaging spectrometer

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[0049] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention and the accompanying drawings. Apparently, the described embodiments do not limit the present invention.

[0050]The sampling of the interference imaging spectrometer varies with temperature (time), resulting in block effects in the block output image, which makes the image uniformity poor. Such as figure 2 It is a quick view of the integrating sphere data collected by the interferometric imaging spectrometer in 1 second. After dark current removal, bad pixel correction and detector response correction, it can be seen that the image still has obvious block effect, and its spatial dimension difference curve (using the interferometric Dimensional average representation) such as image 3 As shown, the downward concave portion of the curve represents the edge of the block.

[0051] In the method for correcting the bl...

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Abstract

The present invention relates to a block effect correction method. In order to solve the problem of the inconsistency in the response of the existing detectors, the dynamic change of the block effect of the detectors is ignored, so it cannot be applied to the correction of the image non-uniformity of a large field of view high-resolution interference imaging spectrometer. The technical problem is solved, and a method for correcting the block effect of an interference imaging spectrometer detector is provided, which includes continuously collecting light source data under different brightness levels of an integrating sphere through an interference imaging spectrometer, dividing the collected data according to the time sequence and at preset time intervals, and then calculating Take the average image, take the average according to the interference dimension to obtain the spatial dimension block effect curve, and then perform polynomial fitting to obtain a smooth curve to eliminate the block effect, and obtain the block effect correction coefficient by the ratio method. The effect correction factor is divided to obtain an interferogram that eliminates the blocking effect.

Description

technical field [0001] The invention relates to a detector block effect correction method, in particular to a detector block effect correction method for an interference imaging spectrometer. Background technique [0002] For large-field-of-view and high-resolution interferometric imaging spectrometers, it is generally necessary to configure a large detector area array due to the requirements for a wide range and high resolution of the acquired images. In the actual manufacturing process of the instrument, the large detector area array is usually spliced ​​by multiple detectors, the CCD drive signal is sent to the CCD after passing through the driver, and the horizontal drive signal of the spectrometer CCD (charge-coupled device) and the AD sampling clock. The phase relationship will change with the temperature, and the delay of the driver to the signal will drift in ns level with the operating temperature of the device, causing the sampling position to drift with the imagin...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28G01J3/45G01J3/02
CPCG01J3/0275G01J3/0297G01J3/2823G01J3/45G01J2003/452
Inventor 陈铁桥李思远李海巍王爽刘学斌张耿冯向朋陈小来刘强刘佳刘杰王一豪
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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