A correction method for detector block effect of interferometric imaging spectrometer

Abstract

The present invention relates to a block effect correction method. In order to solve the problem of the inconsistency in the response of the existing detectors, the dynamic change of the block effect of the detectors is ignored, so it cannot be applied to the correction of the image non-uniformity of a large field of view high-resolution interference imaging spectrometer. The technical problem is solved, and a method for correcting the block effect of an interference imaging spectrometer detector is provided, which includes continuously collecting light source data under different brightness levels of an integrating sphere through an interference imaging spectrometer, dividing the collected data according to the time sequence and at preset time intervals, and then calculating Take the average image, take the average according to the interference dimension to obtain the spatial dimension block effect curve, and then perform polynomial fitting to obtain a smooth curve to eliminate the block effect, and obtain the block effect correction coefficient by the ratio method. The effect correction factor is divided to obtain an interferogram that eliminates the blocking effect.

Description

technical field [0001] The invention relates to a detector block effect correction method, in particular to a detector block effect correction method for an interference imaging spectrometer. Background technique [0002] For large-field-of-view and high-resolution interferometric imaging spectrometers, it is generally necessary to configure a large detector area array due to the requirements for a wide range and high resolution of the acquired images. In the actual manufacturing process of the instrument, the large detector area array is usually spliced ​​by multiple detectors, the CCD drive signal is sent to the CCD after passing through the driver, and the horizontal drive signal of the spectrometer CCD (charge-coupled device) and the AD sampling clock. The phase relationship will change with the temperature, and the delay of the driver to the signal will drift in ns level with the operating temperature of the device, causing the sampling position to drift with the imagin...

AI Technical Summary

Problems solved by technology

[0004] The present invention solves the technical problem that the correction method of the existing detector response inconsistency cannot be applied to image non-uniformity correction of large field of view and high-resolution interference imaging spectrometer due to ignoring the dynamic change of detector block effect, and provides an interferometric Correction Method for Imaging Spectrometer Detector Blocking Effect

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