Clamping assembly and microscope
A clamping component and clamping technology, used in microscopes, optical components, measuring devices, etc., can solve problems such as difficulty in grasping the tension force, torsional deformation of the probe, and reducing the detection accuracy of the cells and tissues to be tested, so as to improve the detection effect. , easy to observe the effect
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Embodiment 1
[0054] This embodiment relates to a clamping assembly for clamping probes. The probe is a large-scale structure, and the length is three times longer than the length of length. When the diameter of the probe is thicker, it may be called a rod; when the diameter of the probe is slightly, it can be referred to as a needle shape; when the diameter of the probe is very fine, it can be referred to as a filament. Therefore, the clamp assembly provided in this embodiment can be clamped to the above probes, and the specific diameter of the probe is not limited.
[0055] Such as figure 1 As shown, the clamp assembly provided in this embodiment includes a clamping substrate 1, a first carrier structure 2, a second bearing structure 3, a first fixing structure 4, and a second fixing structure 5. Wherein, the first bearing structure 2 and the second bearing structure 3 are respectively disposed at both ends of the clamping base 1 in the longitudinal direction, the length direction and the le...
Embodiment 2
[0077] This embodiment relates to a clamping microscope, including a clamp assembly described in the first embodiment. The probe is secured to the stage of the microscope by the clamping assembly, and the cell characteristics are observed by the microscope to derive the conclusion of whether the cells occur. The microscope in this embodiment is a microscope in the prior art. It can be observed by adopting a clamping assembly in the first embodiment.
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