In situ characterization method for bonding interface state under irradiation conditions

A bonding and interface technology, applied in the direction of material excitation analysis, etc., can solve the problems of high requirements for personnel protection, difficulty in meeting long-term use, and insufficient convenience of use, and achieve the effect of meeting long-term use, convenient implementation, and simple characterization methods

Active Publication Date: 2021-10-15
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0008] The purpose of the present invention is to solve the problem that when the existing in-situ characterization method of the bonded interface state under irradiation conditions adopts the radiographic flaw detection method, it relies on large-scale special equipment such as radiation sources, the deployment of the service site is limited by space, and the convenience of use is insufficient; When using the flaw detection method, the requirements for personnel protection under irradiation conditions are high and it is difficult to meet the requirements for long-term use; when using structural dynamics analysis, the radiation resistance of the sensor and its adhesive for pasting needs to be specially studied. In Situ Characterization Method of Adhesive Interface State under Illumination Conditions

Method used

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Embodiment Construction

[0032] The present invention will be further described below in conjunction with embodiment.

[0033] An in-situ characterization method of the bonded interface state under irradiation conditions, comprising the following steps:

[0034] 1) Sampling of bonding interface

[0035] Referring to the research conclusions such as the failure mechanism and degradation law of the target bonding interface, cut and sample the typical state parts of the bonding interface of the real component after irradiation, and use the samples taken to prepare the certificate in the typical state. The sampling process must not introduce For failure modes other than radiation failure mechanism, the number of certificates is recorded as n, and each piece is numbered 1, 2, ... n, where n≥3, preferably n≥5;

[0036] 2) Typical state of calibration

[0037] 2.1) Signal analysis based on laser-induced transient grating spectroscopy

[0038] Use the laser-induced transient grating to irradiate the form c...

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Abstract

The invention relates to an in-situ characterization method of the bonding interface state, in particular to an in-situ characterization method of the bonding interface state under irradiation conditions. The purpose of the present invention is to solve the problem of relying on large-scale special equipment such as radiation sources when using the radiographic flaw detection method in the existing method, the deployment of the service site is limited by space, and the convenience of use is insufficient. The protection requirements are high and it is difficult to meet the requirements of long-term use. When using structural dynamics analysis, the radiation resistance of the sensor and its pasting adhesive needs to be specially studied. It provides an in-situ bonded interface state under irradiation conditions. Characterization method. The method is mainly applied to nuclear power equipment related to irradiation conditions, and realizes non-contact, unmanned, simple, safe and reliable through the steps of bonding interface sampling, typical state calibration, and non-contact in-situ detection at the service site. , Timely characterization of the bonding interface state.

Description

technical field [0001] The invention relates to an in-situ characterization method of the bonding interface state, in particular to an in-situ characterization method of the bonding interface state under irradiation conditions. Background technique [0002] The adhesive structure is composed of different materials, which can simultaneously realize the functions of bearing, sealing, and heat protection in the field of engineering structures. The discontinuous feature of its geometric configuration and the strong discontinuity of its physical properties lead to high mechanical stress at the bonding interface and cause defects such as microcracks at the bonding interface. [0003] For the bonding interface of nuclear power pipeline structure and protective coating, the occurrence of defects such as microcracks will cause the deviation between the service state and the design state, and seriously affect the service reliability. Characterization has become the basic requirement ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/63
CPCG01N21/63
Inventor 姚东高贵龙尹飞闫欣辛丽伟何凯汪韬田进寿
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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