Semiconductor integrated circuit and temperature drift compensation method for semiconductor integrated circuit

Abstract

Embodiments relate to a semiconductor integrated circuit and a temperature drift compensation method for the semiconductor integrated circuit. The semiconductor integrated circuit includes: a bandgap reference circuit configured to generate a reference voltage VREF; a temperature drift compensation circuit coupled to the bandgap reference circuit and configured to compensate for a temperature drift of the reference voltage VREF based on the digital control logic; a micro-current source circuit coupled to the bandgap reference circuit and configured to generate a micro-current IOUT1 based on a reference voltage VREF; and a current amplification and test circuit coupled to the micro-current source circuit and including an operational amplifier U3, a resistor R9, a resistor R10, a heating power triode Q4, and a switch K1, a switch K2 and a switch K3, the current amplification and test circuit being configured to generate a current IIN flowing through the heating power triode Q4 based on the micro-current IOUT1 when the switch K1, the switch K2 and the switch K3 are turned on, thus, the heating power triode Q4 is heated, and the temperature of the environment where the band-gap reference circuit is located is changed.

Description

technical field [0001] Embodiments of the present disclosure generally relate to the field of semiconductor integrated circuits, and more particularly, relate to a semiconductor integrated circuit and a temperature drift compensation method for the semiconductor integrated circuit. Background technique [0002] Reference voltage sources play a very important role in analog signal processing systems and mixed signal processing systems, and are used to provide voltage references for other circuits in the system. For example, reference voltage sources are widely used in many semiconductor integrated circuits such as analog-to-digital converters (ADC), digital-to-analog converters (DAC), sensors, etc., and their accuracy and stability will directly affect the signal processing accuracy of these circuits, such as ADC Or the conversion accuracy of DAC, etc., the sensing signal accuracy of sensors, etc. How to design an accurate and stable reference voltage source has always been ...

AI Technical Summary

Problems solved by technology

[0007] Embodiments of the present disclosure provide a semiconductor integrated circuit and a temperature drift compensation method for a semiconductor integrated circuit, aiming to solve the above-mentioned problems and other potential problems existing in conventional bandgap reference temperature drift solutions

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