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Method and device for determining space electromagnetic radiation of multilayer integrated circuit

A technology of integrated circuits and electromagnetic radiation, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as long calculation time, increasing the number of non-zero elements of sparse matrices, and the complexity of solving sparse matrices

Active Publication Date: 2021-06-18
北京智芯仿真科技有限公司
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Problems solved by technology

Since the method of moments only integrates for the interface, it will reduce a large number of grid units and unknown quantities. However, since the scale of integrated circuits ranges from nanometers to centimeters, directly solving the whole integrated circuit with the finite element method itself will cause problems. Huge sparse matrix, and due to the coupling of the finite element method and the method of moments, the formed coupling matrix is ​​a dense matrix at the interface, which greatly increases the number of non-zero elements of the entire sparse matrix and the complexity of the sparse matrix solution, making the calculation time still very long

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  • Method and device for determining space electromagnetic radiation of multilayer integrated circuit
  • Method and device for determining space electromagnetic radiation of multilayer integrated circuit
  • Method and device for determining space electromagnetic radiation of multilayer integrated circuit

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Embodiment Construction

[0049] In order to make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be described in more detail below in conjunction with the drawings in the embodiments of the present invention.

[0050] It should be noted that: in the drawings, the same or similar symbols represent the same or similar elements or elements with the same or similar functions. The described embodiments are part of the embodiments of the present invention, but not all of the embodiments. In the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0051] In describing the present invention, it is to be understood that...

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Abstract

The invention provides a method and device for determining space electromagnetic radiation of a multilayer integrated circuit, and the method comprises the steps: obtaining an electric field expression, generated at a field point, of a point current source based on a field generated at any position by the point current source expressed by a union vector Green function; taking an electric field expression of the point current source at the field point as an integrated function of a two-dimensional Gaussian integral, dividing an integrated circuit layout with a complex shape into a polygon with a simple shape, and calculating the field generated by the current on the metal plate of the integrated circuit at the same position based on the linear superposition principle of the field; and calculating the fields generated by the current on the layout of the multilayer integrated circuit with the complex shape at different positions in the space, and determining the electromagnetic radiation of the multilayer integrated circuit to the space based on the linear superposition principle of the fields. According to the invention, the electromagnetic radiation generated by the integrated circuit with the multi-layer complex structure to the space is rapidly determined through a semi-analytical method based on the linear superposition principle of the vector Green function and the field.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a method and device for determining space electromagnetic radiation of multilayer integrated circuits. Background technique [0002] When the integrated circuit is working, due to the transmission of high-speed signals on its multi-layer layout, a high-frequency alternating electromagnetic field will be formed. These high-frequency alternating electromagnetic fields will form a high-frequency radiation source, causing crosstalk to other signal layers or other integrated circuits and chips. Therefore, it is necessary to accurately analyze the space electromagnetic radiation of multilayer integrated circuits, and then propose a rectification plan based on the analysis results. [0003] When traditional methods are used to calculate the space electromagnetic radiation of integrated circuits, the integrated circuit and the space to be studied are usually determined as the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/394G06F30/398
CPCG06F30/394G06F30/398
Inventor 唐章宏邹军黄承清王芬汲亚飞
Owner 北京智芯仿真科技有限公司