Method and device for determining space electromagnetic radiation of multilayer integrated circuits

Abstract

The present invention provides a method and device for determining space electromagnetic radiation of a multilayer integrated circuit, wherein the method for determining electromagnetic radiation includes: based on the field generated at any position by a point current source expressed by the dyadic Green's function, the field of the point current source is obtained The electric field expression generated by the point; the electric field expression of the point current source at the field point is used as the integrand function of the two-dimensional Gaussian integral, and the complex-shaped integrated circuit layout is divided into simple-shaped polygons, and the calculation is based on the principle of linear superposition of the field The field generated by the current on the metal plate of the integrated circuit at the same position; calculate the field generated by the current on the complex-shaped multilayer integrated circuit layout at different positions in space, and determine the electromagnetic radiation of the multilayer integrated circuit to the space based on the linear superposition principle of the field . The invention is based on the linear superposition principle of the dyadic Green's function and the field, and quickly determines the electromagnetic radiation generated by the integrated circuit with a multi-layer complex structure to the space through a semi-analytic method.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a method and device for determining space electromagnetic radiation of multilayer integrated circuits. Background technique [0002] When the integrated circuit is working, due to the transmission of high-speed signals on its multi-layer layout, a high-frequency alternating electromagnetic field will be formed. These high-frequency alternating electromagnetic fields will form a high-frequency radiation source, causing crosstalk to other signal layers or other integrated circuits and chips. Therefore, it is necessary to accurately analyze the space electromagnetic radiation of multilayer integrated circuits, and then propose a rectification plan based on the analysis results. [0003] When traditional methods are used to calculate the space electromagnetic radiation of integrated circuits, the integrated circuit and the space to be studied are usually determined as the...

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Problems solved by technology

Since the method of moments only integrates for the interface, it will reduce a large number of grid units and unknown quantities. However, since the scale of integrated circuits ranges from nanometers to centimeters, directly solving the whole integrated circuit with the finite element method itself will cause problems. Huge sparse matrix, and due to the coupling of the finite element method and the method of moments, the formed coupling matrix is ​​a dense matrix at the interface, which greatly increases the number of non-zero elements of the entire sparse matrix and the complexity of the sparse matrix solution, making the calculation time still very long

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