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Entrance pupil off-axis image mapping spectrometer structure

An entrance pupil and spectrometer technology, which is applied in the field of hyperspectral and multispectral imaging, can solve the problems of reduced light intensity of imaging sensors, inability to guarantee the structure, and restrictions on the application of high-throughput and high-quality images of image-mapping spectrometers, achieving improved Imaging quality, reduced assembly difficulty, and compact overall structure

Active Publication Date: 2021-06-25
CHINA JILIANG UNIV
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Problems solved by technology

Although this structure ensures the primary imaging effect on the image mapper, it sacrifices the light flux and reduces the light intensity received by the imaging sensor.
The above two shortcomings limit the high-throughput and high-quality applications of image

Method used

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  • Entrance pupil off-axis image mapping spectrometer structure
  • Entrance pupil off-axis image mapping spectrometer structure
  • Entrance pupil off-axis image mapping spectrometer structure

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Embodiment Construction

[0013] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0014] The coordinates referred to in this article take the optical axis as the z coordinate, and the x and y coordinates are established perpendicular to the optical axis plane.

[0015] The off-axis mentioned in this article means that the center of the aperture stop and the main optical axis of the front lens group are not coaxial.

[0016] The front lens group mentioned in this article can be freely combined with lenses such as spherical lenses, aspheric lenses, and free-form surface lenses.

[0017] The image mapper proposed in this paper consists of several to hundreds of slices with different 2D tilt angles. The two-dimensional inclination of a single slice is (α m , β n ), α m Indicates the inclination angle in the x direction, β n Indicates the inclination in the y direction.

[0018] Such as figure 1 As shown, the present in...

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Abstract

The invention relates to an entrance pupil off-axis image mapping spectrometer which comprises an off-axis aperture (11), a front lens group (12), an image mapper (13), a dispersion element (14), a micro lens array (15) and an imaging sensor (16). The diaphragm is off-axis and the relay lens group is multiplexed, so that the problem that the image quality and the luminous flux in the existing structure are mutually limited is solved, and meanwhile, the overall structure is more compact and the assembly is easier.

Description

technical field [0001] The invention relates to a structure of an incident pupil off-axis image mapping spectrometer and a design scheme thereof, which are suitable for hyperspectral and multispectral imaging fields. Background technique [0002] Image Mapping Spectromertry (IMS) is a snapshot spectral imaging system that maps multiple image slices sharing the same two-dimensional tilt angle to the same pupil through an image mapper. At present, image mapping spectrometer has made important progress in civilian fields such as fluorescence microscopy, in-vivo inspection, remote sensing observation, and food safety inspection. It also has great potential for development. [0003] Each pupil in an image-mapping spectrometer system is shared by multiple slices of the same two-dimensional inclination for higher spatial resolution. One of the key design steps is to ensure crosstalk-free separation of the beam entering the image mapper and the reflected beam. [0004] There are ...

Claims

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Application Information

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IPC IPC(8): G01J3/28G01J3/02
CPCG01J3/28G01J3/0205G01J3/0235
Inventor 周鹏威徐华盛卢田
Owner CHINA JILIANG UNIV
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