Joint debugging method and device, electronic equipment and storage medium
A technology of intelligent equipment and equipment model, applied in electrical digital data processing, software testing/debugging, instruments, etc., can solve the problems of low development efficiency and waste of time, and achieve the effect of saving time and improving development efficiency.
Pending Publication Date: 2021-12-03
GREE ELECTRIC APPLIANCES INC +1
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Problems solved by technology
[0003] In order to solve the above-mentioned technical problems that in the application development stage, whenever application developers need to jointly debug smart devices, they need to repeatedly post the smart devices back and forth, resulting in a lot of waste of time and low development efficiency. The embodiment of the present invention provides a Joint debugging method, device, electronic equipment and storage medium
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[0063] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0064] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstan...
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The embodiment of the invention provides a joint debugging method and device, electronic equipment and a storage medium, and the method comprises the steps: searching for an equipment model of to-be-developed intelligent equipment, and creating virtual equipment corresponding to the equipment model, the virtual equipment being consistent with the equipment model in function; receiving a parameter change instruction sent by an application program, and determining a parameter change logic matched with the parameter change instruction; and under the condition that the parameter change instruction accords with the parameter change logic, changing operation parameters of the virtual equipment according to the parameter change instruction. In this way, the equipment model is designed for the intelligent equipment to be developed, the virtual equipment corresponding to the equipment model is created, the virtual device is used for simulating the intelligent equipment to be developed, the virtual device is made to receive the parameter change instruction sent by the application program, and the data issuing operation of the application program is simulated, so that software can be debugged while being developed, time is saved, and the development efficiency is improved.
Description
technical field [0001] The embodiments of the present invention relate to the technical field of automated testing, and in particular, to a joint debugging method, device, electronic equipment, and storage medium. Background technique [0002] Smart product development is usually divided into smart device development (that is, hardware development) and application program development (that is, software development). In traditional smart product development, smart device development and application program development are often developed independently, especially in terms of physical isolation. Device developers are physically separated from application developers. In the application development stage, whenever the application developers need to connect and debug the smart devices, they need to send the smart devices back and forth repeatedly, resulting in a lot of time wasted and low development efficiency. Contents of the invention [0003] In order to solve the above-me...
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Login to View More IPC IPC(8): G06F11/26G06F11/36
CPCG06F11/26G06F11/3648
Inventor 项伟伟宋德超唐杰张军
Owner GREE ELECTRIC APPLIANCES INC