A Few-Shot Object Classification Method Based on Two-way Structural Contrastive Embedding Learning

A classification method and small sample technology, applied in the field of computer vision, can solve problems such as long training time and multiple computing resources, and achieve the effect of simple implementation method and improved generalization ability.

Active Publication Date: 2022-06-10
ZHEJIANG LAB
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Such methods usually require longer training time and more computing resources

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  • A Few-Shot Object Classification Method Based on Two-way Structural Contrastive Embedding Learning
  • A Few-Shot Object Classification Method Based on Two-way Structural Contrastive Embedding Learning
  • A Few-Shot Object Classification Method Based on Two-way Structural Contrastive Embedding Learning

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[0035] In order to make the purpose, technical solution and technical effect of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0036] The present invention uses large-scale labeled training data of the basic class to construct a classifier based on a deep convolutional network in a supervised manner, and uses the classifier as a teacher path to guide the learning of feature embedding in the student path, and randomly extracts batches from the basic class The image is data enhanced, and the enhanced image is used for structured contrastive embedding learning. By adding structural similarity in the comparative embedding learning process, the learned feature embedding learning network is more generalizable. On this basis, for a new object category, first use a small amount of labeled data in each category to calculate the category prototype, then calculate the similarity between the te...

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Abstract

The present invention relates to the field of computer vision, in particular to a small-sample object classification method based on two-way structure contrast embedding learning, comprising the following steps: Step 1: using large-scale labeled data of basic classes to construct a two-way structure contrast embedding network; step Two: Input a small number of labeled pictures of the new class into the two-way structure comparison embedding network in turn, extract the corresponding picture features, and calculate the mean value of all picture features in each category as the prototype of the category; Step 3: Input the test picture The two-way structure contrasts the embedded network to extract image features, calculates the cosine similarity between the test image features and all categories of prototypes, and normalizes the cosine similarity, and selects the object category with the maximum similarity as the test image. The final prediction result. The method of the invention is simple and flexible, and can improve the generalization ability of the feature embedding learning network, thereby increasing the training speed of the model and improving the classification performance of new class objects.

Description

technical field [0001] The invention relates to the field of computer vision, in particular to a small-sample object classification method based on two-way structure contrast embedding learning. Background technique [0002] In recent years, deep neural network technology has made remarkable progress in a variety of computer vision tasks, and one of the success factors lies in the use of large-scale labeled datasets. However, in many practical scenarios, we usually only have a small amount of labeled data, such as medical image processing, industrial manufacturing, etc. When directly using deep neural networks to solve the above practical problems, it will lead to serious overfitting and model bias. , causing catastrophic performance degradation. In contrast, even preschool children can quickly learn and understand new object concepts after seeing only a few pictures. In order to narrow the ability gap between intelligent machines and human learning, the research on machin...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06V10/74G06V10/764G06K9/62G06N3/04G06N3/08
CPCG06N3/08G06N3/045G06F18/22G06F18/24
Inventor 李亚南李冰斌崔涵王东辉
Owner ZHEJIANG LAB
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