Defect classification method, device, equipment and storage medium
A defect classification and defect technology, applied in image analysis, image enhancement, instruments, etc., can solve problems such as the inability to effectively distinguish between dirty glass covers and real defects, and immature AOI equipment
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[0056] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention.
[0057] In addition, the terms "including" and "having" mentioned in the description of the present application, as well as any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but optionally also includes other unlisted steps or units, or optionally also includes Other steps or elements inherent to the process, method, product or apparatus are included.
[0058] It should be noted that, in the embodiments of the present invention, words such as "exemplary" or "for example" are used for example, illustration or illustration. Any embodiment or design solution described as "exemplary" or "for example" in the embodiments of...
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