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Defect classification method, device, equipment and storage medium

A defect classification and defect technology, applied in image analysis, image enhancement, instruments, etc., can solve problems such as the inability to effectively distinguish between dirty glass covers and real defects, and immature AOI equipment

Active Publication Date: 2022-03-15
LENS TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] The invention provides a defect classification method, device, equipment and storage medium, which solves the problem that the AOI equipment in the glass cover detection industry of electronic products in the prior art is not mature enough to effectively distinguish between the dirt on the glass cover and the real defect technical problem

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  • Defect classification method, device, equipment and storage medium
  • Defect classification method, device, equipment and storage medium
  • Defect classification method, device, equipment and storage medium

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Embodiment Construction

[0056] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention.

[0057] In addition, the terms "including" and "having" mentioned in the description of the present application, as well as any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but optionally also includes other unlisted steps or units, or optionally also includes Other steps or elements inherent to the process, method, product or apparatus are included.

[0058] It should be noted that, in the embodiments of the present invention, words such as "exemplary" or "for example" are used for example, illustration or illustration. Any embodiment or design solution described as "exemplary" or "for example" in the embodiments of...

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Abstract

The invention discloses a defect classification method, device, equipment and storage medium, relates to the technical field of glass cover plate defect detection, and solves the problem that AOI equipment in the glass cover plate detection industry of electronic products in the prior art is not mature enough to effectively distinguish glass Dirt on the cover plate and technical problems of true defects. The method comprises: obtaining a bright-field reflected light image and a dark-field transmitted light image of the glass cover plate irradiated by a light source on the glass cover plate to be detected; extracting defect parts in the bright-field reflected light image and the dark-field transmitted light image respectively, and obtaining Bright field defect image and dark field defect image; combine the bright field defect image and the dark field defect image to obtain a combined image, wherein the combined image contains the bright field image and dark field image of the same defect; according to the dirt classification condition and the combined image Classify the defects in the combined image according to the image features of the defect parts in order to determine whether the defects in the combined image are dirt.

Description

technical field [0001] The invention relates to the technical field of glass cover plate defect detection, in particular to a defect classification method, device, equipment and storage medium. Background technique [0002] At present, the manufacturing process of glass covers for mobile phones and other electronic products includes cutting, fine carving, CNC (Computer Numerical Control, CNC machine tool) processing, flat grinding, silk screen printing and other processes, and each process will produce various appearance defects. Therefore, inspectors will be arranged for manual inspection in the corresponding process. The most direct inspection process is flat inspection, blank sheet, finished product and packaging. These four major inspection procedures have invested a lot of human resources, and manual inspection is affected by output and emotion, and the actual inspection effect is not ideal. [0003] With the development of science and technology, the inspection of app...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06T7/136G06T7/62G06T7/64G06T7/90G06V10/764
CPCG06T7/0004G06T7/136G06T7/62G06T7/64G06T7/90G06T2207/10004G06F18/241
Inventor 李谭军
Owner LENS TECH