A microwave effect test system and method with continuously adjustable parameters
A test system and microwave technology, applied in the field of high-power microwave effects, can solve the problems of difficult adjustment of parameters such as frequency and pulse width, poor universality of microwave effect test results, etc., to reduce consumption costs, test results are stable and reliable, and affordable. Effect
Active Publication Date: 2022-04-08
NAVAL UNIV OF ENG PLA
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Problems solved by technology
[0005] Aiming at the defects of the prior art, the object of the present invention is to provide a microwave effect test system and method with continuously adjustable parameters, aiming at solving the difficulty in adjusting parameters such as the frequency and pulse width of the existing high-power microwave source, which leads to the microwave effect test The problem of poor generalizability of the results
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[0045] 1. High power microwave irradiation effect test system and method
[0046] like figure 1 As shown, the present invention provides a high-power microwave irradiation effect test system with continuously adjustable parameters, including a microwave generation module and a microwave monitoring module; a microwave generation module based on a solid-state power amplifier and a modular effector module are used. Due to the large-scale continuous adjustment of microwave parameters; the real-time microwave monitoring module can accurately obtain the power of the front end of the effect object, and obtain an accurate killing threshold; the realization process of the high-power microwave irradiation effect test method is as follows:
[0047] The first step is to build the microwave generation module;
[0048] like figure 1 As shown, the microwave generation module includes a signal source, a solid-state power amplifier, a filter and an antenna connected in sequence;
[0049] Th...
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The invention provides a microwave effect test system and method with continuously adjustable parameters, belonging to the field of high-power microwave effects. The system includes: a microwave generation module and a microwave monitoring module; Power amplifier, filter and microwave antenna; signal source provides microwave signal; solid-state power amplifier amplifies the power of microwave signal; filter eliminates background noise for microwave signal; microwave antenna sends microwave signal; effector module transmits reference information through receiving antenna Combine with the microwave signal after the background noise is eliminated to form a composite signal, and then display the communication status by demodulating the reference information; the microwave monitoring module monitors the microwave signal in the composite signal; when the communication of the effector module is interrupted, according to the composite signal The signal peak voltage of the microwave signal is used to obtain the microwave killing threshold. The invention satisfies effect tests in various application scenarios, has flexible operation and more stable and reliable test results.
Description
technical field [0001] The invention belongs to the field of high-power microwave effects, and more specifically relates to a microwave effect test system and method with continuously adjustable parameters. Background technique [0002] High-power microwaves generally refer to microwaves with a power greater than 100 megawatts. Due to the high power of microwaves, electronic equipment may be damaged to varying degrees after being irradiated. The damage characteristics of high-power microwaves to electronic equipment make it develop rapidly as a soft-kill weapon. The high-power microwave effect test guides the development direction of high-power microwave sources by studying the killing efficiency of microwave parameters on electronic equipment. Microwave parameters include: frequency, power, pulse width, repetition frequency and number of pulses. [0003] At present, there are mainly two methods for the high-power microwave effect test. The first method is to use a high-pow...
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IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 向中武黄立洋孟进毛启东朱丹妮罗康袁玉章王海涛谢明亮
Owner NAVAL UNIV OF ENG PLA