Microwave effect test system and method with continuously adjustable parameters

Abstract

The invention provides a microwave effect test system and method with continuously adjustable parameters, and belongs to the field of high-power microwave effects, and the system comprises a microwave generation module and a microwave monitoring module. The microwave generation module comprises a signal source, a solid-state power amplifier, a filter and a microwave antenna which are connected in sequence; the signal source provides a microwave signal; the solid-state power amplifier carries out power amplification on the microwave signal; the filter eliminates bottom noise of the microwave signal; the microwave antenna sends the microwave signal; an effector module combines the reference information with the microwave signal after the background noise is eliminated through the receiving antenna to form a composite signal, and displays the communication condition through judging whether the reference information can be demodulated or not; the microwave monitoring module monitors microwave signals in the composite signals; and when the communication of the effector module is interrupted, a microwave killing threshold is obtained according to the signal peak voltage of the microwave signal in the composite signal. Effect tests of various application scenes are met, operation is flexible, and test results are more stable and reliable.

Description

technical field [0001] The invention belongs to the field of high-power microwave effects, and more specifically relates to a microwave effect test system and method with continuously adjustable parameters. Background technique [0002] High-power microwaves generally refer to microwaves with a power greater than 100 megawatts. Due to the high power of microwaves, electronic equipment may be damaged to varying degrees after being irradiated. The damage characteristics of high-power microwaves to electronic equipment make it develop rapidly as a soft-kill weapon. The high-power microwave effect test guides the development direction of high-power microwave sources by studying the killing efficiency of microwave parameters on electronic equipment. Microwave parameters include: frequency, power, pulse width, repetition frequency and number of pulses. [0003] At present, there are mainly two methods for the high-power microwave effect test. The first method is to use a high-pow...

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Problems solved by technology

[0005] Aiming at the defects of the prior art, the object of the present invention is to provide a microwave effect test system and method with continuously adjustable parameters, aiming at solving the difficulty in adjusting parameters such as the frequency and pulse width of the existing high-power microwave source, which leads to the microwave effect test The problem of poor generalizability of the results

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