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Backlight test universal jig based on sensing detection regulation and control and test method

A backlight testing and sensing technology, which is used in lamp testing, parts of electrical measuring instruments, measuring electricity, etc. It can solve problems such as a large number of manual operations, easily damaged products, and difficulty in connection testing.

Pending Publication Date: 2022-04-29
BENGBU GAOHUA ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, when testing PCB pins, PIN pins and other products whose pin positions are initially fixed, manual testing is required. The alligator clip clamps one pin and then the other pin. After the test is completed Then remove the crocodile clip, the test requires a lot of manual operation, and the speed is slow, and the product is easy to be damaged
[0003] In addition, in the processing and production process, there are many types of product specifications, and there are differences in product pin specifications, and in the actual production and processing process, errors are inevitable. The connection test of these backlight product pins with more uncertainties more difficult

Method used

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  • Backlight test universal jig based on sensing detection regulation and control and test method
  • Backlight test universal jig based on sensing detection regulation and control and test method
  • Backlight test universal jig based on sensing detection regulation and control and test method

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Experimental program
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Effect test

Embodiment 1

[0026] see figure 1 , figure 2 , image 3 , in the present invention, the upper side area of ​​the base plate 1 is fixed, the horizontal push plate 2 can push the backlight to be tested to move linearly in the horizontal direction, the vertical push plate 3 can push the backlight to be tested 12 to move linearly in the longitudinal direction, and the side limit baffle 13 The backlight to be tested forms a limit on one side, and also forms a guide during the pushing process of the horizontal push plate 2. When the horizontal push plate 2 pushes the backlight to be tested laterally, the exposed pin 19 of the backlight to be tested enters the pin to detect the photoelectric sensor. When the sensor module 21 enters the foot sensing side 22, the main processing controller obtains the distance between the two exposed pins 19, the vertical position that the exposed pin 19 occupies on the pin detection photoelectric sensor module 21, and the main processing The controller drives th...

Embodiment 2

[0028] see figure 2 , image 3 , there is still a certain distance between the test probe 16 and the boundary of the touch sensing side 24 of the probe detection photoelectric sensor module 23, that is, a sensing detection accuracy of the probe detection photoelectric sensor module 23, for example image 3 In the distance d, after the exposed pin 19 enters the touch sensing side 24 of the probe detection photoelectric sensing module 23, it first and then occupies the first sensing detection accuracy position on the inner side of the boundary of the touch sensing side 24, That is, the exposed pins 19 come into contact with the test probes 16 after advancing a further distance d.

[0029] However, in actual situations, after the exposed pin 19 enters the touch sensing side 24 and occupies a distance d of sensing detection accuracy, it is too late for the lateral drive device 4 to prepare to stop. In order to solve this contradiction, a test probe 16 with a certain degree of e...

Embodiment 3

[0031]In the present invention, the pin detection photoelectric sensor module 21 and the probe detection photoelectric sensor module 23 are all built-in a large number of matrix-arrayed photoelectric elements, such as the pin detection photoelectric sensor module 21 and the probe detection photoelectric sensor The array distribution of the photoelectric elements of module 23 is:

[0032] ...[pin detection photoelectric sensor module coordinate matrix parameters]; ...[probe detection photoelectric sensor module coordinate matrix parameters];

[0033] The main processing controller parameterizes the horizontal and vertical coordinates of the pin detection photoelectric sensor module 21 and the probe detection photoelectric sensor module 23 according to the position of the array distribution, and the corresponding XOY two-dimensional coordinates are formed in the main processing controller. dimensional parameter coordinates, the coordinate parameter information in the pin det...

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Abstract

The invention discloses a universal backlight test fixture based on sensing detection regulation and control and a test method, and relates to the technical field of LED product detection. According to the invention, a pressure sensing strip is embedded in one side of a side limiting baffle plate; a pin detection photoelectric sensing module used for sensing and detecting exposed pins is embedded in the upper side face of the fixed base plate. The upper side area of the fixed substrate plate is provided with a probe substrate which moves directionally, and one side of the probe substrate is provided with a plurality of test probes of which the intervals are increased in sequence; a probe detection photoelectric sensing module for sensing and detecting the test probe is embedded in the upper side surface of the fixed base plate; a main control box is installed on the bottom side face of the fixed base plate, and a main processing controller is arranged in the main control box. According to the invention, targeted test probe matching, adjustment and cooperative connection of the exposed pins are realized, and the test operation of the backlight part can be automatically and conveniently completed in a low-loss manner.

Description

technical field [0001] The invention relates to the technical field of LED product detection, in particular to a universal fixture and testing method for backlight testing based on sensing detection and regulation. Background technique [0002] At present, LED backlight products have a variety of outlets (outlets, PCB pins, PIN needles, etc.). For example, when testing PCB pins, PIN pins and other products whose pin positions are initially fixed, manual testing is required. The alligator clip clamps one pin and then the other pin. After the test is completed Then remove the crocodile clip, the test requires a lot of manual operation, and the speed is slow, and the product is easy to be damaged. [0003] In addition, in the processing and production process, there are many types of product specifications, and there are differences in product pin specifications, and in the actual production and processing process, errors are inevitable. The connection test of these backlight ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/44G01R1/04G01R1/02
CPCG01R31/44G01R1/04G01R1/0408G01R1/02
Inventor 马小飞曹安宁
Owner BENGBU GAOHUA ELECTRONICS