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Short circuit detection method and system for testing interface unit

A technology for testing interfaces and short-circuit detection, which is used in short-circuit testing, single semiconductor device testing, components of electrical measuring instruments, etc.

Pending Publication Date: 2022-05-13
INTEL PROD CHENGDU CO LTD +1
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  • Abstract
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Problems solved by technology

Therefore, even after all the test pins of the test interface unit are manually corrected, there is no guarantee that the corrected test pins will not cause a short circuit of the test pins when they come into contact with the contacts of the packaging unit

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  • Short circuit detection method and system for testing interface unit
  • Short circuit detection method and system for testing interface unit
  • Short circuit detection method and system for testing interface unit

Examples

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[0024] The subject matter described herein will now be discussed with reference to example implementations. It should be understood that the discussion of these implementations is only to enable those skilled in the art to better understand and realize the subject matter described herein, and is not intended to limit the protection scope, applicability or examples set forth in the claims. Changes may be made in the function and arrangement of elements discussed without departing from the scope of the disclosure. Various examples may omit, substitute, or add various procedures or components as needed. For example, the methods described may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with respect to some examples may also be combined in other examples.

[0025] It is to be noted that references in the specification to "one embodiment," "an embodiment," "some embodiments," etc. me...

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Abstract

The invention provides a short circuit detection method for a test interface unit, the test interface unit is provided with a plurality of test pins, and the method comprises the following steps: enabling the plurality of test pins of the test interface unit to be in contact with a plurality of contacts of a to-be-tested packaging unit; determining whether short circuit exists in a plurality of test pins of the test interface unit; and if it is determined that the short circuit exists in the plurality of test pins of the test interface unit, determining the position of the short-circuited pin in the plurality of test pins of the test interface unit. The invention also provides a short circuit detection system for testing the interface unit.

Description

technical field [0001] The present disclosure relates generally to the field of post-package testing, and more particularly, to short circuit detection methods and systems for testing interface units. Background technique [0002] After the semiconductor device is packaged, it is necessary to use a test interface unit (TIU, test interface unit) to perform various electrical function tests on the package unit (for example, CPU, south bridge chip, north bridge chip, etc.) to measure whether the electrical function of the package unit is Meet the design requirements. A corresponding test interface unit is selected for different packaging units, and the test interface unit has a plurality of test pins with a pitch of micron level. As shown in FIG. 1( a ), when using the test interface unit 100 to perform an electrical function test on the package unit 110 , the test pins 120 of the test interface unit 100 are in close contact with the contacts 130 of the package unit 110 to be ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/52G01R31/26G01R1/04
CPCG01R31/52G01R31/26G01R1/0408
Inventor 胥芸菠陈允健
Owner INTEL PROD CHENGDU CO LTD
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